G:	PHYSICS
G01:	MEASURING (counting G06M); TESTING
G01R:	MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
G01R1/00:	Details of instruments or arrangements of the types included in groups G01R5/00 to G01R13/00 and G01R31/00
G01R1/02:	. General constructional details
G01R1/02A:	. . concerning dedicated user interfaces, e.g. GUI, or dedicated keyboards G01R31/319C5 takes precedence
G01R1/04:	. . Housings; Supporting members; Arrangements of terminals ("burn-in" aspects G01R31/28G2B; terminals H01R; terminal strips or boards H02B; housings for electrical apparatus H05K )
G01R1/04S:	. . . Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets G01R1/067 takes precedence; mass production testing systems G01R31/01; testing of connections G01R31/04; for testing printed circuit boards G01R31/28B4B
G01R1/04S1:	. . . . [N: Connectors, terminals (G01R1/04S2 and G01R1/04S3 take precedence; with measurement function for battery poles G01R31/36V9P; in general H01R)]
G01R1/04S2:	. . . . Test clips, e.g. for IC`s
G01R1/04S3:	. . . . Sockets for IC`s or transistors
G01R1/04S3D:	. . . . . Details
G01R1/04S3D1:	. . . . . . Sockets or component fixtures for RF or HF testing
G01R1/04S3D2:	. . . . . . related to environmental aspects, e.g. temperature
G01R1/04S3D3:	. . . . . . concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
G01R1/04S3T:	. . . . . for TAB IC`s
G01R1/04S3U:	. . . . . Sockets for un-leaded IC`s having matrix type contact fields, e.g. BGA or PGA devices; Sockets for unpackaged, naked chips for IC`s with connecting points around the edges only G01R1/04S3
G01R1/04S4:	. . . . for testing integrated circuits on wafers, e.g. wafer-level test cartridge
G01R1/06:	. . Measuring leads; Measuring probes
G01R1/067:	. . . Measuring probes plugs, sockets or clips G01R1/04S; testing of connections G01R31/04; contacting IC`s for test purposes when probe design is not the essential feature G01R31/28G5; using radiation beam as probe G01R31/302; end pieces for wires terminating in a probe H01R11/18
G01R1/067B:	. . . . Apparatus for holding or moving single probes for moving multiple probe heads or ICs under test G01R31/28G5
G01R1/067C:	. . . . Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins [M1112]
G01R1/067C2:	. . . . . Elastic [M1112]
G01R1/067C2A:	. . . . . . [N: Spring-loaded]
G01R1/067C2C:	. . . . . . Cantilever beams
G01R1/067C3:	. . . . . Geometry aspects G01R1/067C2C takes precedence
G01R1/067C3A:	. . . . . . [N: related to tip portion]
G01R1/067C3B:	. . . . . . [N: Microprobes, i.e. having dimensions as IC details]
G01R1/067C3C:	. . . . . . [N: Needle-like]
G01R1/067C4:	. . . . . [N: Material aspects]
G01R1/067C4A:	. . . . . . related to layers
G01R1/067D:	. . . . Input circuits therefor
G01R1/067H:	. . . . High frequency probes
G01R1/067K:	. . . . High voltage probes
G01R1/067L:	. . . . containing liquids
G01R1/067P:	. . . . Hand-held or hand-manipulated probes, e.g. for oscilloscopes or for portable test instruments end pieces terminating in a probe H01R11/18 [M1112]
G01R1/067S:	. . . . Devices for sensing when probes are in contact, or in position to contact, with measured object
G01R1/07:	. . . . Non-contact-making probes wireless interface with the DUT G01R31/302W
G01R1/073:	. . . . Multiple probes G01R1/067L, G01R1/067S, G01R1/07E, G01R1/07G take precedence
G01R1/073B:	. . . . . with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
G01R1/073B2:	. . . . . . the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support on an elastic support, e.g. a film, G01R1/073B6
G01R1/073B2B:	. . . . . . . the probes being of different lengths
G01R1/073B2C:	. . . . . . . for testing printed circuit boards
G01R1/073B2C2:	. . . . . . . . for double-sided contacting or for testing boards with surface-mounted devices (SMD`s)
G01R1/073B4:	. . . . . . the body of the probe being at an angle other than perpendicular to test object, e.g. probe card
G01R1/073B6:	. . . . . . arranged on a flexible frame or film
G01R1/073B8:	. . . . . . with flexible bodies, e.g. buckling beams
G01R1/073B9:	. . . . . . with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch [M1207]
G01R1/073B9B:	. . . . . . . using an intermediate card or back card with apertures through which the probes pass
G01R1/073B9C:	. . . . . . . using an intermediate adapter, e.g. space transformers G01R1/073B9B takes precedence [M1207]
G01R1/073B9D:	. . . . . . . using switching of signals between probe tips and test bed, i.e. the standard contact matrix which in its turn connects to the tester
G01R1/073E:	. . . . . manipulating each probe element or tip individually
G01R1/07E:	. . . . . containing electro-optic elements
G01R1/07G:	. . . . . containing ionised gas
G01R1/08:	. . Pointers; Scales; Scale illumination
G01R1/10:	. . Arrangements of bearings
G01R1/12:	. . . of strip or wire bearings
G01R1/14:	. . Braking arrangements; Damping arrangements
G01R1/16:	. . Magnets
G01R1/18:	. . Screening arrangements against electric or magnetic fields, e.g. against earth`s field measuring shielding efficiency H05K9/00G
G01R1/20:	. Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments
G01R1/20B:	. . Resistors used for electric measuring e.g. decade resistors standards, resistors for comparators, series resistors, shunts resistors in general H01C; microwave or radiowave terminations H01P1/26; coupling devices H01R
G01R1/20C:	. .  Terminals (battery pole connectors combined with measurement function G01R31/36V9P, in general H01R13/00)[C1112]
G01R1/20D:	. . Switches for connection of measuring instruments or electric motors to measuring loads (switches in general H01H)
G01R1/22:	. . Tong testers acting as secondary windings of current tranformers
G01R1/24:	. . Transmission-line, e.g. waveguide, measuring sections, e.g. slotted section
G01R1/26:	. . . with linear movement of probe
G01R1/28:	. Provision in measuring instruments for reference values, e.g. standard voltage, standard waveform
G01R1/30:	. Structural combination of electric measuring instruments with basic electronic circuits, e.g. with amplifier
G01R1/36:	. Overload protection arrangements or circuits for electric measuring instruments
G01R1/38:	. Arrangements for altering the indicating characteristic, e.g. by modifying the air gap circuits G01R15/00C
G01R1/40:	. Modifications of instruments to indicate the maximum or the minimum value reached in a time interval, e.g. by maximum indicator pointer
G01R1/42:	. . thermally operated
G01R1/44:	. Modifications of instruments for temperature compensation When measuring current or voltage G01R19/32
G01R3/00:	Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments, e.g. of probe tips
G01R5/00:	Instruments for converting a single current or a single voltage into a mechanical displacement
G01R5/02:	. Moving-coil instruments
G01R5/04:	. . with magnet external to the coil
G01R5/06:	. . with core magnet
G01R5/08:	. . specially adapted for wide angle deflection; with eccentrically-pivoted moving coil
G01R5/10:	. String galvanometers
G01R5/12:	. Loop galvanometers
G01R5/14:	. Moving-iron instruments
G01R5/16:	. . with pivoting magnet
G01R5/18:	. . with pivoting soft iron, e.g. needle galvanometer
G01R5/20:	. Induction instruments e.g. Ferraris instruments
G01R5/22:	. Thermoelectric instruments
G01R5/24:	. . operated by elongation of a strip or wire or by expansion of a gas or fluid
G01R5/26:	. . operated by deformation of a bimetallic element
G01R5/28:	. Electrostatic instruments
G01R5/30:	. . Leaf electrometers
G01R5/32:	. . Wire electrometers; Needle electrometers
G01R5/34:	. . Quadrant electrometers
G01R7/00:	Instruments capable of converting two or more currents or voltages into a single mechanical displacement
G01R7/02:	. for forming a sum or a difference
G01R7/04:	. for forming a quotient
G01R7/06:	. . moving-iron type
G01R7/08:	. . moving-coil type, e.g. crossed-coil type
G01R7/10:	. . . having more than two moving coils
G01R7/12:	. for forming product
G01R7/14:	. . moving-iron type
G01R7/16:	. . having both fixed and moving coils, i.e. dynamometers
G01R7/18:	. . . with iron core magnetically coupling fixed and moving coils
G01R9/00:	Instruments employing mechanical resonance
G01R9/02:	. Vibration galvanometers, e.g. for measuring current
G01R9/04:	. using vibrating reeds, e.g. for measuring frequency
G01R9/06:	. . magnetically driven
G01R9/08:	. . piezo-electrically driven
G01R11/00:	Electromechanical arrangements for measuring time integral of electric power i.e. electric energy or current, e.g. of consumption
G01R11/02:	. Constructional details
G01R11/04:	. . Housings; Supporting racks; Arrangements of terminals
G01R11/06:	. . Magnetic circuits of induction meters
G01R11/067:	. . . Coils therefor
G01R11/073:	. . . Armatures therefor
G01R11/09:	. . . . Disc armatures
G01R11/10:	. . Braking magnets; Damping arrangements
G01R11/12:	. . Arrangements of bearings
G01R11/14:	. . . with magnetic relief
G01R11/16:	. . Adaptations of counters to electricity meters
G01R11/17:	. . Compensating for errors; Adjusting or regulating means therefor
G01R11/18:	. . . Compensating for variations in ambient conditions
G01R11/185:	. . . . Temperature compensation
G01R11/19:	. . . Compensating for errors caused by disturbing torque, e.g. rotating-field errors of polyphase meters
G01R11/20:	. . . Compensating for phase errors in induction meters
G01R11/21:	. . . Compensating for errors caused by damping effects of the current, e.g. adjustment in the overload range
G01R11/22:	. . . Adjusting torque, e.g. adjusting starting torque, adjusting of polyphase meters for obtaining equal torques
G01R11/23:	. . . Compensating for errors caused by friction, e.g. adjustment in the light load range
G01R11/24:	. . Arrangements for avoiding or indicating fraudulent use measures against unauthorised operation of bolts, nuts or pins F16B41/00C; security seals G09F3/03; preventing of tampering with detection circuits in signaling or alarm circuits G08B29/04B
G01R11/25:	. . Arrangements for indicating or signalling faults
G01R11/30:	. Dynamo-electric motor meters
G01R11/32:	. . Watt-hour meters
G01R11/34:	. . Ampere-hour meters
G01R11/36:	. Induction meters, e.g. Ferraris meters
G01R11/38:	. . for single-phase operation
G01R11/40:	. . for polyphase operation
G01R11/42:	. . . Circuitry therefor
G01R11/46:	. Electrically-operated clockwork meters; Oscillatory meters; Pendulum meters
G01R11/46B:	. . Oscillatory meters
G01R11/48:	. Meters specially adapted for measuring real or reactive components; Meters specially adapted for measuring apparent energy
G01R11/50:	. . for measuring real component
G01R11/52:	. . for measuring reactive component
G01R11/54:	. . for measuring simultaneously at least two of the following three variables: real component, reactive component, apparent energy
G01R11/56:	. Special tariff meters
G01R11/57:	. . Multi-rate meters
G01R11/58:	. . . Tariff-switching devices therefor
G01R11/60:	. . Subtraction meters; Meters measuring maximum or minimum load hours
G01R11/63:	. . Over-consumption meters, e.g. measuring consumption while a predetermined level of power is exceeded
G01R11/64:	. . Maximum meters, e.g. tariff for a period is based on maximum demand within that period
G01R11/66:	. . . Circuitry
G01R13/00:	Arrangements for displaying electric variables or waveforms
G01R13/02:	. for displaying measured electric variables in digital form
G01R13/02B:	. . in numerical form
G01R13/02C:	. . Circuits therefor
G01R13/02C2:	. . . Controlling the intensity or colour of the display
G01R13/02C3:	. . . for presentation of more than one variable
G01R13/02C4:	. . . for inserting reference markers
G01R13/02C5:	. . . for triggering, synchronisation
G01R13/02C5B:	. . . . for non-recurrent functions, e.g. transients
G01R13/02C6:	. . . for sampling
G01R13/02D:	. . using electro-optic elements
G01R13/02E:	. . Software therefor
G01R13/04:	. for producing permanent records
G01R13/06:	. . Modifications for recording transient disturbances e.g. by starting or accelerating a recording medium
G01R13/08:	. . Electromechanical recording systems using a mechanical direct-writing method
G01R13/10:	. . . with intermittent recording by representing the variable by the length of a stroke or by the position of a dot
G01R13/12:	. . Chemical recording, e.g. clydonographs
G01R13/14:	. . Recording on a light-sensitive material
G01R13/16:	. . Recording on a magnetic medium
G01R13/18:	. . . using boundary displacement
G01R13/20:	. Cathode-ray oscilloscopes; Oscilloscopes using other screens than CRT`s, e.g. LCD`s; control arrangements or circuits for cathode-ray tube indicators G09G1/00; cathode ray tubes H01J31/00
G01R13/20B:	. . Non-electric appliances, e.g. scales, masks luminescent screens for CRT provided with permanent marks or references H01J29/34; optical or photographic arrangements combined with CRT vessels H01J29/89
G01R13/20C:	. . Using means for generating permanent registrations, e.g. photographs optical or photographic arrangements combined with CRT vessel H01J 29/89
G01R13/20D:	. . Arrangements for obtaining a 3- dimensional representation stereoscopic T.V. H04N13/00
G01R13/20E:	. . Arrangements for measuring with C.R. oscilloscopes, e.g. vectorscope
G01R13/22:	. . Circuits therefor
G01R13/22B:	. . . particularly adapted for storage oscilloscopes
G01R13/24:	. . . Time-base deflection circuits
G01R13/24B:	. . . . for generating more than one, not overlapping time-intervals on the screen
G01R13/26:	. . . Circuits for controlling the intensity of the electron beam or the colour of the display
G01R13/28:	. . . Circuits for simultaneous or sequential presentation of more than one variable
G01R13/30:	. . . Circuits for inserting reference markers, e.g. for timing, for calibrating, for frequency marking
G01R13/30B:	. . . . for time marking
G01R13/32:	. . . Circuits for displaying non-recurrent functions such as transients; Circuits for triggering; Circuits for sychronisation; Circuits for time-base expansion
G01R13/32B:	. . . . for displaying non-recurrent functions such as transients
G01R13/34:	. . . Circuits for representing a single waveform by sampling, e.g. for very high frequencies
G01R13/34B:	. . . . for displaying periodic H.F. signals G01R13/34C takes precedence
G01R13/34C:	. . . . for displaying sampled signals by using digital processors by intermediate A.D. and D.A. convertors (control circuits for CRT indicators)
G01R13/34D:	. . . . using electro-optic elements
G01R13/36:	. using length of glow discharge, e.g. glowlight oscilloscopes
G01R13/38:	. using the steady or oscillatory displacement of a light beam by an electromechanical measuring system
G01R13/40:	. using modulation of a light beam otherwise than by mechanical displacement, e.g. by Kerr effect visual indication of correct tuning H03J3/14
G01R13/40B:	. . for continuous analogue, or simulated analogue, display
G01R13/40B2:	. . . using active, i.e. light-emitting display devices, e.g. electroluminescent display G01R13/36 and G01R13/42 take precedence
G01R13/40B3:	. . . using passive display devices, e.g. liquid crystal display or Kerr effect display devices
G01R13/40C:	. . for discontinuous display, i.e. display of discrete values analogue/digital conversion H03M1/00
G01R13/40C2:	. . . using a plurality of active, i.e. light emitting, e.g. electro-luminescent elements, i.e. bar graphs
G01R13/40C2B:	. . . . representing measured value by a dot or a single line G01R13/40C4 takes precedence
G01R13/40C3:	. . . using a plurality of passive display elements, e.g. liquid crystal or Kerr-effect display elements G01R13/40C4 takes precedence
G01R13/40C4:	. . . Two or three dimensional representation of measured values
G01R13/42:	. Instruments using length of spark discharge e.g. by measuring maximum separation of electrodes to produce spark
G01R15/00:	Details of measuring arrangements of the types provided for in groups G01R17/00 to G01R29/00 and G01R33/00 to G01R35/00
G01R15/00B:	. Switches for altering the measuring range or for multitesters
G01R15/00C:	. Circuits for altering the indicating characteristic, e.g. making it non-linear
G01R15/00C2:	. . by zero-suppression
G01R15/04:	. Voltage dividers
G01R15/06:	. . having reactive components, e.g. capacitive transformer when the HV capacitor/sensor as such is the essential G01R15/16
G01R15/08:	. Circuits for altering the measuring range
G01R15/09:	. . Autoranging circuits
G01R15/12:	. Circuits for multi-testers, i.e. multimeters , e.g. for measuring voltage, current, or impedance at will
G01R15/12B:	. . for digital multimeters
G01R15/14:	. Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
G01R15/14B:	. . Arrangements for simultaneous measurements of several parameters employing techniques covered by groups G01R15/14 to G01R15/26
G01R15/14C:	. . Measuring arrangements for voltage not covered by other subgroups of G01R15/14
G01R15/14D:	. . Measuring arrangements for current not covered by other subgroups of 15/14, e.g. using current dividers, shunts, or measuring a voltage drop if no voltage isolation is involved G01R1/20B or G01R19/00G
G01R15/14D2:	. . . involving the measuring of a magnetic field or electric field G01R15/18, G01R15/20, G01R15/24, G01R15/26 take precedence
G01R15/16:	. . using capacitive devices circuits constituting a voltage divider G01R15/06
G01R15/16B:	. . . measuring electrostatic potential, e.g. with electrostatic voltmeters or electrometers, when the design of the sensor is essential electrometers with passively moving electrodes G01R5/28; measuring electrostatic fields G01R29/12; measuring charge G01R29/24; measuring in circuits with high internal resistance G01R19/00B
G01R15/18:	. . using inductive devices, e.g. transformers
G01R15/18B:	. . . using coils without a magnetic core, e.g. Rogowski coils [M1112]
G01R15/18C:	. . . using transformers with a magnetic core
G01R15/18C2:	. . . . with compensation or feedback windings or interacting coils, e.g. 0-flux sensors using galvano-magnetic field sensors G01R15/20; conversion of DC into AC using transductors G01R19/20
G01R15/18D:	. . . using current transformers with a core consisting of two or more parts, e.g. clamp-on type G01R15/14B to G01R15/16 take precedence; tong testers G01R1/22
G01R15/18E:	. . . comprising rotatable parts, e.g. moving coils galvanometers G01R5/02, G01R5/14
G01R15/20:	. . using galvano-magnetic devices, e.g. Hall-effect devices, i.e. measuring a magnetic field via the interaction between a current and a magnetic field, e.g. magneto resistive or Hall effect devices electromechanical such devices, G01R5/00, G01R7/00, G01R9/00; measuring magnetic fields G01R33/02
G01R15/20B:	. . . using Hall-effect devices Hall elements in arrangements for measuring electrical power G01R21/08
G01R15/20C:	. . . using magneto-resistance devices, e.g. field plates
G01R15/20D:	. . . Constructional details independent of the type of device used
G01R15/22:	. . using light-emitting devices, e.g. LED, optocouplers [N: (G01R31/319A takes precedence)]
G01R15/24:	. . using light-modulating devices
G01R15/24B:	. . . using electro-optical modulators, e.g. electro-absorption probes containing electro-optic elements G01R1/07E
G01R15/24B2:	. . . . based on the Pockels effect, i.e. linear electro-optic effect
G01R15/24B3:	. . . . based on the Kerr effect, i.e. quadratic electro-optic effect
G01R15/24C:	. . . using magneto-optical modulators, e.g. based on the Faraday or Cotton-Mouton effect
G01R15/24C2:	. . . . based on the Faraday, i.e. linear magneto-optic, effect
G01R15/24D:	. . . Details of the circuitry or construction of devices covered by 15/24B to 15/24C2
G01R15/24E:	. . . using a constant light source and electro-mechanically driven deflectors
G01R15/26:	. . using modulation of waves other than light, e.g. radio or acoustic waves
G01R17/00:	Measuring arrangements involving comparison with a reference value, e.g. bridge
G01R17/02:	. Arrangements in which the value to be measured is automatically compared with a reference value
G01R17/04:	. . in which the reference value is continuously or periodically swept over the range of values to be measured
G01R17/06:	. . Automatic balancing arrangements
G01R17/08:	. . . in which a force or torque representing the measured value is balanced by a force or torque representing the reference value
G01R17/10:	. ac or dc measuring bridges
G01R17/10B:	. . for measuring impedance or resistance
G01R17/12:	. . using comparison of currents, e.g. bridges with differential current output
G01R17/14:	. . with indication of measured value by calibrated null indicator, e.g. percent bridge, tolerance bridge
G01R17/16:	. . with discharge tubes or semiconductor devices in one or more arms of the bridge, e.g. voltmeter using a difference amplifier
G01R17/18:	. . with more than four branches
G01R17/20:	. ac or dc potentiometric measuring arrangements
G01R17/22:	. . with indication of measured value by calibrated null indicator
G01R19/00:	Arrangements for measuring currents or voltages or for indicating presence or sign thereof
G01R19/00A:	. Frequency selective voltage or current level measuring measuring frequency G01R23/00; testing attenuation in line transmission systems H04B3/48; monitoring testing in transmission systems H04B17/00
G01R19/00A2:	. . separating AC and DC
G01R19/00B:	. Measuring currents or voltages from sources with high internal resistance by means of measuring circuits with high input impedance, e.g. OP-amplifiers Electrostatic instruments G01R5/28; measuring electrostatic potential G01R15/16B; measuring electrostatic fields G01R29/12; amplifiers per se H03F
G01R19/00C:	. Measuring mean values of current or voltage during a given time interval
G01R19/00D:	. Circuits for comparing several input signals and for indicating the result of this comparison e.g. equal, different, greater, smaller (comparing pulses or pulse trains according to amplitude)
G01R19/00E:	. characterised by a specific application or detail not covered by any other subgroup of G01R19/00 (contains no documents)
G01R19/00E2:	. . Noise discrimination; Analog sampling; Measuring transients measuring characteristics of individual pulses G01R29/02; digital sampling G01R19/25C2; measuring noise figure G01R29/26
G01R19/00E3:	. . Measuring currents of particle-beams, currents from electron multipliers, photocurrents, ion currents; Measuring in plasmas
G01R19/00E4:	. . measuring voltage or current standards
G01R19/00E5:	. . using thermionic valves
G01R19/00F:	. measuring voltage only all subgroups of G01R19/00 take precedence
G01R19/00G:	. measuring current only all subgroups of G01R19/00 take precedence
G01R19/02:	. Measuring effective values, i.e. root-mean-square values
G01R19/03:	. . using thermoconverters using ac-dc conversion by means of thermocouples or other heat sensitive elements G01R19/22T
G01R19/04:	. Measuring peak values or amplitude or envelope of ac or of pulses
G01R19/06:	. Measuring real component; Measuring reactive component
G01R19/08:	. Measuring current density
G01R19/10:	. Measuring sum, difference or ratio
G01R19/12:	. Measuring rate of change emergency protective circuit arrangements responsive to the rate of change of electrical quantities H02H3/44
G01R19/14:	. Indicating direction of current; Indicating polarity of voltage
G01R19/145:	. Indicating the presence of current or voltage measuring probes in general G01R1/06; indicating continuity or short circuits in electric apparatus or lines or components G01R31/02C
G01R19/15:	. . Indicating the presence of current see provisionally also G01R19/145
G01R19/155:	. . Indicating the presence of voltage see provisionally also G01R19/145
G01R19/165:	. Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
G01R19/165E:	. . characterised by the components employed (contains no documents)
G01R19/165E2:	. . . using electromagnetic relays, e.g. reed relay magnetically driven reeds G01R9/06
G01R19/165E3:	. . . using electronic tubes
G01R19/165E4:	. . . using FET`s
G01R19/165E5:	. . . using diodes, e.g. Zener diodes
G01R19/165F:	. . using digital techniques or performing arithmetic operations using digital techniques to measure a voltage or a current, see G01R19/25
G01R19/165G:	. . characterised by the application (contains no documents)
G01R19/165G2:	. . . in AC or DC supplies G01R19/165E4 and G01R19/165F take precedence
G01R19/165G2B:	. . . . for batteries charge condition monitoring in G01R31/36
G01R19/165G2C:	. . . . voltage or current in AC supplies switching for protection H02H; circuits for emergency power supply H02J9/00
G01R19/165G2D:	. . . . in I.C. power supplies
G01R19/165G3:	. . . Logic probes, i.e. circuits indicating logic state (high, low, O); modifications of electronic switches or gates for indicating state of switch H03K17/18
G01R19/165G4:	. . . in hand-held circuit testers see also G01R19/155
G01R19/165H:	. . Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/165E, G01R19/165F, G01R19/165G (contains no documents)
G01R19/165H2:	. . . [N: comparing AC or DC current with one threshold, e.g. load current, over-current, surge current or fault current
G01R19/165H2B:	. . . . where the current drives a transistor or the voltage drop across a load resistance causes further action
G01R19/165H3:	. . . comparing DC or AC voltage with one threshold G01R19/165E3, G01R19/165E4, G01R19/165F, G01R19/165G and G01R19/165H5 take precedence
G01R19/165H3B:	. . . . AC voltage or recurrent signals
G01R19/165H4:	. . . for individual pulses, ripple or noise and other applications where timing or duration is of importance G01R19/165E4, G01R19/165G2 and G01R19/165H5B take precedence; for pulse duration and rise time, see G01R29/02 and subgroups
G01R19/165H5:	. . . to indicate that the value is within or outside a predetermined range of values (window) G01R19/165E3, G01R19/165E4, G01R19/165F and G01R19/165G take precedence
G01R19/165H5B:	. . . . with multi level indication G01R19/165E4 and G01R19/165G take precedence
G01R19/17:	. . giving an indication of the number of times this occurs, i.e. multi-channel analysers
G01R19/175:	. Indicating the instants of passage of current or voltage through a given value, e.g. passage through zero
G01R19/18:	. using conversion of dc into ac, e.g. with choppers DC amplifiers with modulators at input and demodulator at output H03F3/38
G01R19/20:	. . using transductors i.e. a magnetic core transducer the saturation of which is cyclically reversed by an AC source on the secondary side other DC current transducers, e.g. using the 0-flux principle, G01R15/18C2; magnetic amplifiers H03F9/00
G01R19/22:	. using conversion of ac into dc
G01R19/22T:	. . by means of thermocouples or other heat sensitive elements
G01R19/25:	. using digital measurement techniques Analogue/digital conversion H03M
G01R19/252:	. . using analogue/digital converters of the type with conversion of voltage or current into frequency and measuring of this frequency
G01R19/255:	. . using analogue/digital converters of the type with counting of pulses during a period of time proportional to voltage or current, delivered by a pulse generator with fixed frequency
G01R19/257:	. . using analogue/digital converters of the type with comparison of different reference values with the value of voltage or current, e.g. using step-by-step method
G01R19/25B:	. . for measuring voltage only, e.g. digital volt meters (DVM`s) G01R19/25C to G01R19/257 take precedence
G01R19/25C:	. . Arrangements for conditioning or analysing measured signals, e.g. for indicating peak values G01R19/00C takes precedence; Details concerning sampling, digitizing or waveform capturing displaying waveforms G01R13/00; analog sampling G01R19/00E2
G01R19/25C2:	. . . Details concerning sampling, digitizing or waveform capturing
G01R19/25D:	. . Arrangements for monitoring electric power systems, e.g. power lines or loads; Logging
G01R19/25E:	. . Modular arrangements for computer based systems; using personal computers (PC`s), e.g. "virtual instruments"
G01R19/28:	. adapted for measuring in circuits having distributed constants
G01R19/30:	. Measuring the maximum or the minimum value of current or voltage reached in a time interval
G01R19/32:	. Compensating for temperature change
G01R21/00:	Arrangements for measuring electric power or power factor
G01R21/00A:	. Measuring real or reactive component; Measuring apparent energy G01R21/01, G01R21/02, G01R21/08, G01R21/10 and G01R21/127 take precedence
G01R21/00A2:	. . Measuring real component
G01R21/00A4:	. . Measuring reactive component
G01R21/00A6:	. . Measuring apparent power
G01R21/00B:	. Measuring power factor
G01R21/00D:	. Adapted for special tariff measuring G01R21/01, G01R21/02, G01R21/08, G01R21/10, G01R21/127C and G01R21/133C take precedence
G01R21/00D2:	. . Measuring maximum demand
G01R21/01:	. in circuits having distributed constants
G01R21/02:	. by thermal methods e.g. calorimetric
G01R21/04:	. . in circuits having distributed constants
G01R21/06:	. by measuring current and voltage
G01R21/07:	. . in circuits having distributed constants
G01R21/08:	. by using galvanomagnetic effect devices, e.g. Hall effect devices
G01R21/09:	. . in circuits having distributed constants
G01R21/10:	. by using square-law characteristics of circuit elements, e.g. diodes, to measure power absorbed by loads of known impedance
G01R21/12:	. . in circuits having distributed constants
G01R21/127:	. by using pulse modulation
G01R21/127B:	. . Measuring real or reactive component, measuring apparent energy
G01R21/127B1:	. . . Measuring real component
G01R21/127B2:	. . . Measuring reactive component
G01R21/127B3:	. . . Measuring apparent energy
G01R21/127C:	. . Adapted for special tariff measuring
G01R21/133:	. by using digital technique
G01R21/133B:	. . Measuring real or reactive component, measuring apparent energy
G01R21/133C:	. . adapted for special tariff measuring
G01R21/133C1:	. . . Tariff switching circuits
G01R21/133C2:	. . . Measuring overconsumption
G01R21/133C3:	. . . Measuring maximum demand
G01R21/14:	. Compensating for temperature change
G01R22/00:	Arrangements for measuring time integral of electric power or current, e.g. by electricity meters (electromechanical arrangements therefor G01R11/00; monitoring electric consumption of electrically-propelled vehicles B60L3/00; coin freed devices G07F15/00)]
G01R22/02:	. by electrolytic methods
G01R22/04:	. by calorimetric methods
G01R22/06:	. by electronic methods
G01R22/06C:	. .  Details of electricity meters relating to remote communication (remote reading of utility meters G01D4/00R and G01D4/00S)[N0409][C0706]
G01R22/06D:	. . Details of electronic electricity meters
G01R22/06D1:	. . . related to remote communication
G01R22/06D2:	. . . related to mechanical aspects
G01R22/06D3:	. . . Arrangements for avoiding or indicating fraudulent use
G01R22/06D4:	. . . Arrangements for indicating or signaling faults
G01R22/08:	. . using analogue techniques
G01R22/10:	. . using digital techniques
G01R23/00:	Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
G01R23/00D:	. Circuits for comparing several input signals and for indicating the result of this comparison, e.g. equal, different, greater, smaller (comparing phase or frequency of 2 mutually independent oscillations in demodulators)
G01R23/02:	. Arrangements for measuring frequency, e.g. pulse repetition rate using vibrating reeds G01R9/04 Arrangements for measuring period of current or voltage
G01R23/04:	. . adapted for measuring in circuits having distributed constants
G01R23/06:	. . by converting frequency into an amplitude of current or voltage
G01R23/07:	. . . using response of circuits tuned on resonance, e.g. grid-drip meter
G01R23/08:	. . . using response of circuits tuned off resonance
G01R23/09:	. . . using analogue integrators, e.g. capacitors establishing a mean value by balance of input signals and defined discharge signals or leakage
G01R23/10:	. . by converting frequency into a train of pulses, which are then counted, i.e. converting the signal into a square wave
G01R23/12:	. . by converting frequency into phase shift
G01R23/14:	. . by heterodyning; by beat-frequency comparison
G01R23/14B:	. . . by heterodyning or by beat-frequency comparison with the harmonic of an oscillator
G01R23/15:	. . Indicating that frequency of pulses is either above or below a predetermined value or within or outside a predetermined range of values, by making use of non-linear or digital elements (indicating that pulse width is above or below a certain limit)
G01R23/15B:	. . . giving an indication of the number of times this occurs, i.e. multi-channel analysers (for pulse characteristics)
G01R23/16:	. Spectrum analysis; Fourier analysis computing with Fourier series or Walsh functions G06F17/14, G06G7/19; spectral data processing
G01R23/163:	. . adapted for measuring in circuits having distributed constants
G01R23/165:	. . using filters
G01R23/167:	. . . with digital filters
G01R23/17:	. . with optical or acoustical auxiliary devices
G01R23/173:	. . Wobbulating devices similar to swept panoramic receivers
G01R23/175:	. . by delay means, e.g. tapped delay lines
G01R23/177:	. . Analysis of very low frequencies
G01R23/18:	. . with provision for recording frequency spectrum
G01R23/20:	. . Measurement of non-linear distortion, [N: e.g. harmonics or noise, (G01R31/317J takes precedence; noise figure G01R29/26)]
G01R25/00:	Arrangements for measuring phase angle between a voltage and a current, or between voltages or currents
G01R25/00D:	. Circuits for comparing several input signals and for indicating the result of this comparison e.g. equal, different, greater, smaller, or for passing one of the input signals as output signal
G01R25/02:	. in circuits having distributed constants
G01R25/04:	. involving adjustment of a phase shifter to produce a predetermined phase difference, e.g. zero difference
G01R25/06:	. employing quotient instrument
G01R25/08:	. by counting of standard pulses
G01R27/00:	Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom measuring super-conductive properties G01R33/12G
G01R27/02:	. Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
G01R27/02B:	. . Measuring very high resistances, e.g. isolation resistances, i.e. megohm-meters
G01R27/04:	. . in circuits having distributed constants, e.g. having very long conductors or involving high frequencies
G01R27/06:	. . . Measuring reflection coefficients; Measuring standing-wave ratio
G01R27/08:	. . Measuring resistance by measuring both voltage and current
G01R27/10:	. . . using two-coil or crossed-coil instruments forming quotient
G01R27/12:	. . . . using hand generators, e.g. meggers
G01R27/14:	. . Measuring resistance by measuring current or voltage obtained from a reference source
G01R27/16:	. . Measuring impedance of element or network through which a current is passing from another source, e.g. cable, power line
G01R27/18:	. . . Measuring resistance to earth, i.e. line to ground
G01R27/20:	. . Measuring earth resistance; Measuring contact resistance, e.g. of earth connections, e.g. plates
G01R27/20B:	. . . Measuring contact resistance of connections, e.g. of earth connections
G01R27/22:	. . Measuring resistance of fluids
G01R27/26:	. . Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants; Measuring impedance or related variables
G01R27/26B:	. . . [N: Measuring capacitance (capacitive sensors G01D5/24)]
G01R27/26C:	. . . Measuring inductance
G01R27/26D:	. . . Measuring dielectric properties, e.g. constants testing dielectric strength G01R31/12; detecting insulation faults G01R31/02C2; G01R27/26E takes precedence
G01R27/26D3:	. . . . Measuring-systems or electronic circuits G01R27/26D4, G01R27/26D5 take precedence
G01R27/26D3B:	. . . . . Bridge circuits bridges for measuring loss angle G01R27/26E2
G01R27/26D4:	. . . . Sample holders, electrodes or excitation arrangements, e.g. sensors or measuring cells
G01R27/26D4B:	. . . . . of plate type, i.e. with the sample sandwiched in the middle
G01R27/26D4C:	. . . . . of coaxial or concentric type, e.g. with the sample in a coaxial line
G01R27/26D4C2:	. . . . . . open-ended type, e.g. abutting against the sample
G01R27/26D4D:	. . . . . Cavities, resonators, free space arrangements, reflexion or interference arrangements G01R27/26D4C takes precedence; optical methods G01R27/26D5
G01R27/26D4D2:	. . . . . . Transmission line, wave guide (closed or open-ended) or strip - or microstrip line arrangements
G01R27/26D4E:	. . . . . Coils or antennae arrangements, e.g. coils surrounding the sample or transmitter/receiver antennae
G01R27/26D4P:	. . . . . Probes
G01R27/26D5:	. . . . using optical methods or electron beams
G01R27/26E:	. . . Measuring quality factor or dielectric loss, e.g. loss angle, or power factor power factor related to power measurements G01R21/00B; testing capacitors G01R31/01B2
G01R27/26E2:	. . . . Measuring dielectric loss, e.g. loss angle, loss factor or power factor
G01R27/28:	. Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks using network analysers Measuring transient response
G01R27/30:	. . with provision for recording characteristics, e.g. by plotting Nyquist diagram
G01R27/32:	. . in circuits having distributed constants, e.g. having very long conductors or involving high frequencies
G01R29/00:	Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 to G01R27/00
G01R29/02:	. Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time, duration
G01R29/027:	. . Indicating that a pulse characteristic is either above or below a predetermined value or within or beyond a predetermined range of values
G01R29/027C:	. . . the pulse characteristic being duration i.e. width (indicating that frequency of pulses is above or below a certain limit)
G01R29/027D:	. . . the pulse characteristic being rise time (measuring rate of change 19/12)
G01R29/02P:	. . Measuring pulse width
G01R29/033:	. . . giving an indication of the number of times this occurs, i.e. multi-channel analysers (the characteristic being frequency)
G01R29/04:	. Measuring form factor, i.e. quotient of root-mean-square value and arithmetic mean of instantaneous value; Measuring peak factor, i.e. quotient of maximum value and root-mean-square value
G01R29/06:	. Measuring depth of modulation
G01R29/08:	. Measuring electromagnetic field characteristics measuring electrostatic fields G01R29/12; for determining a voltage G01R15/14; measuring magnetic fields G01R33/00; Receiver signal strength indication (RSSI) H04B17/00B1
G01R29/08A:	. . characterised by the application (not used, see subgroups)
G01R29/08A3:	. . . Field measurements related to measuring influence on or from apparatus, components or humans EMC, EMI and similar testing in general G01R31/00E, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning
G01R29/08A3B:	. . . . rooms and test sites therefor, e.g. anechoic chambers, open field sites or TEM cells for testing antennas G01R29/10B
G01R29/08A3B2:	. . . . . TEM-cells
G01R29/08A3C:	. . . . Testing shielding, e.g. for efficiency
G01R29/08A3D:	. . . . Measurements related to lightning, e.g. measuring electric disturbances, warning systems
G01R29/08A3E:	. . . . for detecting presence or location of electric lines or cables fault detection G01R31/02; fault location G01R31/08
G01R29/08A3F:	. . . . Dosimetry, i.e. measuring the time integral of radiation intensity; Level warning devices for personal safety use Nuclear radiation dosimetry G01T
G01R29/08E:	. . characterised by constructional or functional features (not used, see subgroups)
G01R29/08E2:	. . . Complete apparatus or systems; circuits, e.g. receivers or amplifiers G01R29/08E3, G01R29/08E4 take precedence; dosimeters, warning devices 29/08A3F
G01R29/08E3:	. . . Sensors; antennas; probes; detectors Wave guide measuring sections G01R1/24
G01R29/08E3B:	. . . . using optical probes, e.g. electro-optical, luminiscent, glow discharge, or optical interferometers
G01R29/08E4:	. . . Details related to signal analysis or treatment; presenting results, e.g. displays; measuring specific signal features other than field strength, e.g. polarisation, field modes, phase, envelope, maximum value
G01R29/10:	. . Radiation diagrams of aerials; Antenna testing in general
G01R29/10B:	. . . using anechoic chambers; Chambers or open field sites used therefor test sites used for measuring on other objects than aerials G01R29/08A3B2; wave absorbing devices H01Q17/00
G01R29/12:	. Measuring electrostatic fields or voltage-potential
G01R29/14:	. . Measuring field distribution
G01R29/16:	. Measuring asymmetry of polyphase networks
G01R29/18:	. Indicating phase sequence; Indicating synchronism
G01R29/20:	. Measuring number of turns; Measuring transformation ratio or coupling factor of windings [M1112]
G01R29/22:	. Measuring piezo-electric properties
G01R29/24:	. Arrangements for measuring quantities of charge
G01R29/26:	. Measuring noise figure; Measuring signal-to-noise ratio Measuring jitter, i.e. phase noise, distortion G01R23/20; noise measuring in individual transistors G01R31/26C2N, G01R31/26C3N
G01R31/00:	Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere [M1205]
G01R31/00E:	. Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing measuring electromagnetic fields G01R29/08; circuits for generating HV pulses in dielectric strength testing G01R31/14
G01R31/00E2:	. . where the device under test is an electronic circuit
G01R31/00F:	. Environmental or reliability tests of individual semiconductors G01R31/26E; of PCB's G01R31/28B5E; of IC's G01R31/28G2; of other circuits G01R31/28F4G
G01R31/00T:	. Testing of electric installations on transport means
G01R31/00T2:	. . on road vehicles, e.g. automobiles or trucks testing of ignition installations peculiar to internal combustion engines F02P17/00
G01R31/00T2B:	. . . using microprocessors or computers
G01R31/00T3:	. . on air- or spacecraft, railway rolling stock or sea-going vessels
G01R31/01:	. Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
G01R31/01B:	. . Testing passive components relays G01R31/327C2; electrical windings, e.g. inductors G01R31/06
G01R31/01B2:	. . . Testing of capacitors measuring capacitance G01R27/26B
G01R31/02:	. Testing of electric apparatus, lines or components, for short-circuits, discontinuities, leakage of current , or incorrect line connection G01R31/00E, G01R31/00T, G01R31/01, G01R31/08, G01R31/12, G01R31/24, G01R31/26, G01R31/28, G01R31/327, G01R31/34, G01R31/36, G01R31/40, G01R31/44 take precedence; measuring electromagnetic field leakage G01R29/08A3B; testing of sparking plugs H01T13/58
G01R31/26B2:	. . . for testing solar cells
G01R31/28E7:	. . . Testing of telecommunication circuits
G01R31/02B:	. . Testing of cables or conductors testing of electric windings G01R31/06; testing of insulation of cables G01R31/12F5B; testing LANs H04L12/26T; testing line transmission systems H04B3/46 [M1112]
G01R31/02B2:	. . . Testing while the cable or conductor passes continuously the testing apparatus, e.g. during manufacturing
G01R31/02B3:	. . . Identification of wires in a multicore cable
G01R31/02C:	. . Arrangements for indicating continuity or short-circuits in electric apparatus or lines, leakage or ground faults in electric windings G01R31/06; measuring resistance to earth G01R27/18 [M1112]
G01R31/02C2:	. . . Testing short circuits, leakage or ground faults detecting failure within the drive train of electrically-propelled vehicles B60L3/00F
G01R31/02C4:	. . . Testing continuity G01R31/44 takes precedence
G01R31/02D:	. . Testing of transformers testing of electric windings G01R31/06
G01R31/02E:	. . Testing of capacitors
G01R31/36M4:	. . .  based on combined current, voltage and further parameters measurements, e.g. temperature, internal resistance
G01R31/38:	. Testing of sparking-plugs
G01R31/04:	. . Testing connections, e.g. of plugs, of non-disconnectable joints [N: (G01R31/317K7 takes precedence; testing of connections in integrated circuits, chip-to-lead connections, bond wires G01R31/28G1)]
G01R31/04B:	. . . Testing of correct wire connections in electrical apparatus and circuits details concerning insertion or connection of batteries H02J7/00E2
G01R31/04C:	. . . of releaseable connections, e.g. terminals mounted on a printed circuit board
G01R31/04C2:	. . . . of plugs, sockets or terminals at the end of a cable or a wire harness; of wall sockets; of power sockets in appliances
G01R31/04D:	. . . of connections between components and printed circuit boards (PCB`s) G01R31/04C takes precedence
G01R31/04D2:	. . . . Details concerning testing solder joints
G01R31/06:	. . Testing of electric windings e.g. of solenoids, inductors , e.g. for polarity G01R31/02D and G01R31/34C take precedence
G01R31/06B:	. . . Testing armature or field winding of dynamo-electric machines (testing dynamo-electric machines in general G01R31/34)
G01R31/07:	. . Testing of fuses
G01R31/08:	. Locating faults in cables, transmission lines, or networks (emergency protective circuit arrangements H02H) installing, maintaining, repairing or dismantling electric cables or lines H02G1/00;testing LAN`s H04L12/26T [M1112]
G01R31/08B:	. . without the use of digital techniques
G01R31/08B2:	. . . in cables
G01R31/08B3:	. . . in power transmission or distribution lines[C0006]
G01R31/08B4:	. . . in networks or circuits, e.g. power distribution systems[C0006]
G01R31/08C:	. . using digital techniques
G01R31/08D:	. . according to type of conductors
G01R31/08D2:	. . . in cables, e.g. underground [M1112]
G01R31/08D3:	. . . in power transmission or distribution lines, e.g.overhead [M1112]
G01R31/08D4:	. . . in power transmission or distribution networks, i.e. with interconnected conductors [M1112]
G01R31/08F:	. . Aspects of digital computing
G01R31/10:	. . by increasing destruction at fault, e.g. burning-in by using a pulse generator operating a special programme
G01R31/11:	. . using pulse reflection methods
G01R31/12:	. Testing dielectric strength or breakdown voltage; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing G01R31/06, G01R31/08 and G01R31/327 take precedence; measuring in plasmas G01R19/00E3; Measuring dielectric constants G01R27/26D; ESD, EMC or EMP testing of circuits G01R31/00E2
G01R31/12D:	. . using acoustic measurements acoustic measurements G01H3/00
G01R31/12E:	. . using optical methods; using charged particle, e.g. electron, beams or X-rays
G01R31/12F:	. . of components, parts or materials G01R31/12D, G01R31/12E , G01R31/18 take precedence; circuits therefor G01R31/14; testing vessels of electrodes G01R31/16 [M1112]
G01R31/12F2:	. . . of surge arresters Monitoring overvoltage diverters or arresters H02H3/04E
G01R31/12F3:	. . . of line insulators or spacers, e.g. ceramic overhead line cap insulators; of insulators in HV bushings
G01R31/12F4:	. . . of gas-insulated power appliances or vacuum gaps testing switches G01R31/327; detecting electrical or mechanical defects in encased switchgear H02B13/065
G01R31/12F5:	. . . of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation
G01R31/12F5B:	. . . . of cable, line or wire insulation, e.g. using partial discharge measurements locating faults in cables G01R31/08B2
G01R31/12F5C:	. . . . of liquids or gases
G01R31/12F5D:	. . . . of components or parts made of semiconducting materials; of LV components or parts G01R31/18 takes precedence
G01R31/14:	. . Circuits therefor, e.g. for generating test voltages, sensing circuits G01R31/12D to G01R31/12F take precedence; for testing switches G01R31/327
G01R31/16:	. . Construction of testing vessels; Electrodes therefor
G01R31/18:	. . Subjecting similar articles in turn to test, e.g. go/no-go tests in mass production
G01R31/20:	. . Preparation of articles or specimens to facilitate testing
G01R31/24:	. Testing of discharge tubes
G01R31/24B:	. . Testing of gas discharge tubes
G01R31/25:	. . Testing of vacuum tubes
G01R31/25E:	. . . Testing of electron multipliers, e.g. photo-multipliers
G01R31/25H:	. . . Testing of transit-time tubes, e.g. klystrons, magnetrons
G01R31/25S:	. . . Testing of beam-tubes, e.g. cathode-ray tubes, image pick-up tubes of channel image intensifier arrays G01R31/25E; of transit time tubes G01R31/25H
G01R31/26:	. Testing of individual semiconductor devices
G01R31/265:	. . Contactless testing of circuits, also in wafer-form G01R31/302
G01R31/265B:	. . . using electron beams
G01R31/265C:	. . . using non-ionising electromagnetic radiation, e.g. optical radiation
G01R31/26A:	. . Apparatus or methods therefor G01R31/26C, G01R31/26E take precedence
G01R31/26A2:	. . . for curve tracing of semiconductor characteristics, e.g. on oscilloscope
G01R31/26A3:	. . . for testing individual solar cells
G01R31/26C:	. . Circuits therefor G01R31/26E takes precedence
G01R31/26C10:	. . . for testing charge coupled devices
G01R31/26C2:	. . . for testing bipolar transistors
G01R31/26C2B:	. . . . for measuring break-down voltage or punch through voltage therefor
G01R31/26C2F:	. . . . for measuring frequency response characteristics, e.g. cut-off frequency thereof
G01R31/26C2G:	. . . . for measuring gain factor thereof
G01R31/26C2N:	. . . . for measuring noise measuring noise factor in general G01R29/26
G01R31/26C2S:	. . . . for measuring switching properties thereof
G01R31/26C2T:	. . . . for measuring thermal properties thereof
G01R31/26C3:	. . . for testing field effect transistors, i.e. FET`s
G01R31/26C3B:	. . . . for measuring break-down voltage therefor
G01R31/26C3G:	. . . . for measuring gain factor thereof
G01R31/26C3N:	. . . . for measuring noise measuring noise factor in general G01R29/26
G01R31/26C3T:	. . . . for measuring thermal properties thereof
G01R31/26C4:	. . . for testing thyristors
G01R31/26C6:	. . . for testing diodes
G01R31/26C6S:	. . . . for measuring switching properties thereof
G01R31/26C6T:	. . . . Testing light-emitting diodes, laser diodes or photodiodes [M1112]
G01R31/26C8:	. . . for testing other individual devices G01R31/26C2 to G01R31/26C6, G01R31/27 take precedence
G01R31/26C8M:	. . . . for testing field-effect devices, e.g. of MOS-capacitors G01R31/26C3 takes precedence
G01R31/26E:	. . Testing semiconductor operation lifetime or reliability, e.g. by accelerated life tests
G01R31/26M:	. . Adaptations of individual semiconductor devices to facilitate the testing thereof
G01R31/26N:	. . for measuring noise G01R31/26C2N, G01R31/26C3N take precedence
G01R31/26P:	. . Characterising semiconductor materials testing of materials or semi-finished products G01R31/28E11; testing during manufacture H01L22/00 [M1205]
G01R31/27:	. . Testing of devices without physical removal from the circuit of which they form part, e.g. compensating for effects surrounding elements testing printed circuit boards G01R31/28B
G01R31/27B:	. . . for testing individual semiconductor components within integrated circuits
G01R31/28:	. Testing of electronic circuits, e.g. by signal tracer
G01R31/28B:	. . [N: Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages (MCP) (G01R31/3185M1 takes precedence; contactless testing G01R31/302; testing contacts or connections G01R31/04)]
G01R31/28B2:	. . . by means of functional tests, e.g. logic-circuit-simulation or algorithms therefor testing electronic digital computers G06F11/00
G01R31/28B3:	. . . Bare printed circuit boards
G01R31/28B4:	. . . Apparatus therefor, e.g. test stations, drivers, analysers, conveyers G01R31/28B3, G01R31/28B5, G01R31/28B6 take precedence
G01R31/28B4B:	. . . . Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards probe, multiprobe, probe manipulator or probe fixture G01R1/067
G01R31/28B5:	. . . Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing G01R31/28B6 takes precedence
G01R31/28B5B:	. . . . Checking for open circuits or shorts, e.g. solder bridges; Testing conductivity, resistivity or impedance of connections G01R31/04
G01R31/28B5C:	. . . . Checking the presence, location, orientation or value, e.g. resistance, of components or conductors orientation of the DUT with respect to the test fixture G01R1/067B, G01R31/28B5
G01R31/28B5D:	. . . . Functional tests, e.g. boundary scans, using the normal I/O contacts contacting devices G01R31/28B4B; testing digital circuits G01R31/317, G06F11
G01R31/28B5E:	. . . . Environmental-, stress-, or burn-in tests of IC's G01R31/28G2; of individual semiconductors G01R31/26E; of other circuits G01R31/28F4G
G01R31/28B6:	. . . using test structures on, or modifications of, the card under test, made for the purpose of testing, e.g. additional components or connectors G01R31/28B3 takes precedence; printed circuits having e.g. symbols, test patterns or visualisation means H05K1/02D
G01R31/28E:	. . Testing of electronic circuits specially adapted for particular applications not provided for elsewhere G01R31/28B and G01R31/28G take precedence
G01R31/28E11:	. . . Testing of materials or semi-finished products, e.g. semiconductor wafers or substrates G01R31/3185M3 takes precedence; testing during manufacture H01L22/00 [M1205]
G01R31/28E3:	. . . of microwave or radiofrequency circuits of attenuation, gain, e.g. using network analyzers G01R27/28
G01R31/28E3B:	. . . . testing of oscillators or resonators
G01R31/28E6:	. . . in household appliances or professional audio/video equipment testing loudspeakers H04R29/00, testing LAN`s H04L12/26T; testing TV systems H04N17/00
G01R31/28E8:	. . . Testing of electronic protection circuits testing switches G01R31/327; checking alarm systems G08B29/00; self test of summation current transformers H02H3/33E2
G01R31/28E9:	. . . N: Testing of circuits in sensor or actuator systems ] [M1112]
G01R31/28F:	. . Specific tests of electronic circuits not provided for elsewhere contains no documents; G01R31/28B and G01R31/316 take precedence
G01R31/28F3:	. . . Automated test systems (ATE); using microprocessors or computers G01R31/317 takes precedence; ATE for detection of defective computer hardware G06F11/273A; special purpose computers for testing G06F15/20B
G01R31/28F4:	. . . Fault-finding or characterising G01R31/28E3 to G01R31/28E11 take precedence
G01R31/28F4B:	. . . . Characterising or performance testing, e.g. of frequency response transient response G01R27/28
G01R31/28F4C:	. . . . [N: using signal generators, power supplies or circuit analysers (G01R31/28G2D2 takes precedence; multimeters G01R15/12, network analysers G01R27/28)]
G01R31/28F4C2:	. . . . . Signal generators
G01R31/28F4D:	. . . . In-circuit-testing
G01R31/28F4E:	. . . . [N: using test interfaces, e.g. adapters, test boxes, switches, PIN drivers (G01R31/28G5C takes precedence)]
G01R31/28F4F:	. . . . using hard- or software simulation or using knowledge-based systems, e.g. expert systems, artificial intelligence or interactive algorithms
G01R31/28F4F2:	. . . . . using simulation
G01R31/28F4G:	. . . . Environmental or reliability testing, e.g. burn-in or validation tests of individual semiconductors G01R31/26E; of printed circuits boards G01R31/28B5E; of IC's G01R31/28G2
G01R31/28G:	. . Testing of integrated circuits (IC) G01R31/317 takes precedence; testing individual devices G01R31/26; testing printed circuits G01R31/28B
G01R31/28G1:	. . . [N: Electrical testing of internal connections or -isolation, e.g. latch-up or chip-to-lead connections (G01R31/317K7 takes precedence; test of chip-to-PCB or lead-to-PCB connections G01R31/04)]
G01R31/28G2:	. . . Environmental, reliability or burn-in testing
G01R31/28G2A:	. . . . [N: Internal circuit aspects, e.g. built-in test features; Test chips; Measuring material aspects, e.g. electro migration (EM)]
G01R31/28G2A1:	. . . . . [N: Measuring of material aspects, e.g. electro-migration (EM), hot carrier injection]
G01R31/28G2B:	. . . . [N: External aspects, e.g. related to chambers, contacting devices or handlers]
G01R31/28G2B1:	. . . . . [N: Chambers or ovens; Tanks]
G01R31/28G2B2:	. . . . . [N: Contacting devices, e.g. sockets, burn-in boards or mounting fixtures (in general G01R1/04)]
G01R31/28G2B3:	. . . . . [N: Holding devices, e.g. chucks; Handlers or transport devices (having contacts G01R31/28G2B2)]
G01R31/28G2B3A:	. . . . . . [N: Handlers or transport devices, e.g. loaders, carriers, trays]
G01R31/28G2B4:	. . . . . [N: Complete testing stations; systems; procedures; software aspects]
G01R31/28G2B4A:	. . . . . . [N: Procedures; Software aspects]
G01R31/28G2D:	. . . . related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
G01R31/28G2D1:	. . . . . [N: related to temperature]
G01R31/28G2D1A:	. . . . . . [N: related to heating]
G01R31/28G2D1B:	. . . . . . [N: related to cooling]
G01R31/28G2D2:	. . . . . [N: related to electrical aspects, e.g. to voltage or current supply or stimuli or to electrical loads]
G01R31/28G2D3:	. . . . . [N: related to environmental aspects other than temperature, e.g. humidity or vibrations]
G01R31/28G3:	. . . Testing timing characteristics
G01R31/28G4:	. . . [N: using dedicated test connectors, test elements or test circuits on the IC under test (G01R31/28G2 takes precedence)]
G01R31/28G5:	. . . Features relating to contacting the IC under test, e.g. probe heads; chucks G01R31/28G2B3 takes precedence, test connections, e.g. test sockets, or probes per se, G01R1/04 or G01R1/06
G01R31/28G5B:	. . . . involving moving the probe head or the IC under test; docking stations moving single probes G01R1/067B; moving individual probes in multiple probes G01R1/073E
G01R31/28G5C:	. . . . Interfaces, e.g. between probe and tester G01R31/319C1 and G01R1/073B9 take precedence
G01R31/28G5D:	. . . . [N: related to sensing or controlling of force, position, temperature (G01R31/28G2D1 takes precedences; sensing of force G01L; sensing of position G01B, G01D; sensing of temperature G01K; controlling in general G05)]
G01R31/28G6:	. . . [N: Handling, conveying or loading, e.g. belts, boats, vacuum fingers (G01R31/28G2B3A takes precedence; handling semiconductor devices or wafers during manufacture or treatment H01L21/67)]
G01R31/28G7:	. . . [N: Aspects of quality control (QC) (G01R31/317L takes precedence; program control for QC G05B19/418Q)]
G01R31/28G8:	. . . Testing of IC packages; Test features related to IC packages containers per se H01L23/02, encapsulations per se H01L23/28
G01R31/28G9:	. . . Sample preparation, e.g. removing encapsulation, etching sample preparation in general G01N1/00
G01R31/30:	. . Marginal testing, e.g. varying supply voltage
G01R31/302:	. . Contactless testing G01R31/04 takes precedence
G01R31/302W:	. . . Wireless interface with the DUT
G01R31/303:	. . . of integrated circuits
G01R31/304:	. . . of printed or hybrid circuits
G01R31/305:	. . . using electron beams investigating or analysing materials by measuring photoelectric effect G01N23/227
G01R31/306:	. . . . of printed or hybrid circuits
G01R31/307:	. . . . of integrated circuits
G01R31/308:	. . . using non-ionising electromagnetic radiation, e.g. optical radiation investigating or analysing materials by the use of optical meansG01N21/00; image analysis G06T7/00
G01R31/309:	. . . . of printed or hybrid circuits or circuit substrates
G01R31/30C:	. . . Current or voltage test
G01R31/30C1:	. . . . Quiescent current [IDDQ test or leakage current test] [M1111]
G01R31/30C3:	. . . . Built-In-Current test (BIC)
G01R31/30D:	. . . Delay or race condition test, e.g. race hazard test [M1111]
G01R31/311:	. . . . of integrated circuits G01R31/317W takes precedence
G01R31/312:	. . . by capacitive methods
G01R31/315:	. . . by inductive methods
G01R31/316:	. . Testing of analog circuits G01R31/28G takes precedence
G01R31/3161:	. . . Marginal testing
G01R31/3163:	. . . Functional testing
G01R31/3167:	. . Testing of combined analog and digital circuits testing ADC`s H03M1/10T
G01R31/317:	. . Testing of digital circuits [N: WARNING: The following subgroups of G01R31/317 are not complete due to an ongoing reorganisation : G01R31/317B, G01R31/317J, G01R31/317J5, G01R31/317K7, G01R31/317L, G01R31/317W, G01R31/319A. See also G01R31/317 and its other subgroups]
G01R31/3173:	. . . Marginal testing
G01R31/3177:	. . . Testing of logic operation, e.g. by logic analysers
G01R31/317A:	. . . Arrangements for setting the Unit Under Test (UUT) in a test mode
G01R31/317B:	. . . [N: Testing digital circuits including elements other than semiconductor transistors, e.g. biochips, nano-fabrics, mems, chips with magnetic elements]
G01R31/317C:	. . . Comparison aspects, e.g. signature analysis, comparators concerning scan tests G01R31/3185S7; concerning testers G01R31/3193
G01R31/317D:	. . . Design for test; Design verification concerning scan tests G01R31/3185S12; computer-aided design G06F17/50 [M1111]
G01R31/317F:	. . . Debugging aspects, e.g. using test circuits for debugging, using dedicated debugging test circuits generation of test sequences therefor G01R31/3183F1, using scan test therefor G01R31/3185S3
G01R31/317G:	. . . involving differential digital signals, e.g. testing differential signal circuits, using differential signals for testing
G01R31/317H:	. . . Test strategies methods for generation of test sequences G01R31/3183M
G01R31/317J:	. . . [N: Analysis of signal quality (G01R31/319A takes precedence; measuring frequencies or analysing frequency spectra per se G01R23/00; measuring non-linear distortion per se G01R23/20)]
G01R31/317J1:	. . . . Jitter measurements; Jitter generators measuring jitter, noise figure or signal-to-noise ratio per se G01R29/26; analysis of tester signals G01R31/319A [M1111]
G01R31/317J3:	. . . . [N: BER (Bit Error Rate) test]
G01R31/317J5:	. . . . [N: Evaluation methods, e.g. shmoo plots]
G01R31/317K:	. . . Input or output aspects
G01R31/317K1:	. . . . Input or output interfaces for test, e.g. test pins, buffers for scan test G01R31/3185S9
G01R31/317K3:	. . . . Testing of input or output circuits; test of circuitry between the I/C pins and the functional core, e.g. testing of input or output driver, receiver, buffer
G01R31/317K5:	. . . . Testing of input or output with loop-back
G01R31/317K7:	. . . . [N: Interconnect testing (by scan techniques see G01R31/3185S3l)]
G01R31/317L:	. . . [N: Logistic aspects, e.g. binning, selection, sorting of devices under test, tester/handler interaction networks, Test management software, e.g. software for test statistics or test evaluation, yield analysis (mechanical aspects G01R31/28B4B, G01R31/28G) ]
G01R31/317M:	. . . Security aspects, e.g. preventing unauthorised access during test
G01R31/317N:	. . . Optimisation aspects, e.g. using functional pin as test pin, pin multiplexing
G01R31/317P:	. . . Power aspects, e.g. power supplies for test circuits, power saving during test for scan test G01R31/3185S10
G01R31/317Q:	. . . Addressing or selecting of test units, e.g. transmission protocols for selecting test units for scan test G01R31/3185S6
G01R31/317R:	. . . Hardware for routing the test signal within the device under test to the circuits to be tested, e.g. multiplexer for multiple core testing, accessing internal nodes routing the test signal to or from the device under test G01R31/319S4
G01R31/317S:	. . . Test controller, e.g. BIST state machine for scan test G01R31/3185S5
G01R31/317T:	. . . Timing aspects, e.g. clock distribution, skew, propagation delay for tester hardware G01R31/3193T
G01R31/317T1:	. . . . Synchronization, e.g. of test, clock or strobe signals; Signals in different clock domains; Generation of Vernier signals; Comparison and adjustment of the signals
G01R31/317U:	. . . Clock circuits aspects, e.g. test clock circuit details, timing aspects for signal generation, circuits for testing clocks G01R31/317T takes precedence; concerning scan test G01R31/3185S4, for tester hardware G01R31/319S2
G01R31/317W:	. . . [N: Optical aspects, e.g. opto-electronics used for testing, optical signal transmission for testing electronic circuits, electro-optic components to be tested in combination with electronic circuits, measuring light emission of digital circuits (probes having electro-optic elements G01R1/07E; electro-optic sampling for oscilloscopes G01R13/34D; contactless testing of individual semiconductor devices by optical means G01R31/265C)]
G01R31/317X:	. . . RF (radio frequency) test
G01R31/3181:	. . . Functional testing
G01R31/3181G:	. . . . Test pattern generators
G01R31/3181S:	. . . . Soft error testing; Soft error rate evaluation; Single event testing
G01R31/3183:	. . . . Generation of test inputs, e.g. test vectors, patterns or sequence
G01R31/3183A:	. . . . . computer-aided, e.g. automatic test program generator (ATPG), program translations, test program debugging
G01R31/3183B:	. . . . . [N: Tools, e.g. program interfaces, test suite, test bench, simulation hardware, test compiler, test program languages (simulation software G01R31/3183F3; emulators G06F11/26S2)]
G01R31/3183C:	. . . . . for combinational circuits
G01R31/3183D:	. . . . . for delay tests
G01R31/3183E:	. . . . . [N: Test pattern compression or decompression (compression or decompression of scan patterns G01R31/3185S3D; compression or decompression hardware G01R31/319S1C)]
G01R31/3183F:	. . . . . by preliminary fault modelling, e.g. analysis, simulation
G01R31/3183F1:	. . . . . . Analysis of test coverage or failure detectability
G01R31/3183F3:	. . . . . . [N: Simulation (computer simulation of digital circuits G06F17/50C)]
G01R31/3183H:	. . . . . as a result of hardware simulation, e.g. in an HDL environment computer-aided simulation of circuits G06F17/50C
G01R31/3183M:	. . . . . Methodologies therefor, e.g. algorithms, procedures
G01R31/3183N:	. . . . . of patterns for devices arranged in a network
G01R31/3183R:	. . . . . [N: Random or pseudo-random test pattern]
G01R31/3183S:	. . . . . for sequential circuits G01R31/3185S3 takes prececence
G01R31/3185:	. . . . Reconfiguring for testing, e.g. LSSD, partitioning
G01R31/3185C:	. . . . . Test of Combinational circuits
G01R31/3185M:	. . . . . Test of Modular systems, e.g. Wafers, MCM`s
G01R31/3185M1:	. . . . . . [N: Board Level Test, e.g. P1500 Standard (features related to boundary scan G01R31/3185S)]
G01R31/3185M3:	. . . . . . [N: Wafer Test]
G01R31/3185M5:	. . . . . . [N: Test of Multi-Chip-Moduls]
G01R31/3185P:	. . . . . Test of programmable logic devices [PLDs ] [M1111]
G01R31/3185P1:	. . . . . . [N: Test of field programmable gate arrays (FPGA)]
G01R31/3185R:	. . . . . Test of Sequential circuits test of microprocessors G06F11/267P, test of ALU`s G06F11/267H
G01R31/3185R1:	. . . . . . Test of flip-flops or latches
G01R31/3185R2:	. . . . . . Test of counters
G01R31/3185R3:	. . . . . . Test of registers
G01R31/3185S:	. . . . . using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
G01R31/3185S1:	. . . . . . Scan chain arrangements, e.g. connections, test bus, analog signals
G01R31/3185S10:	. . . . . . Power distribution; Power saving
G01R31/3185S11:	. . . . . . AC testing, e.g. current testing, burn-in
G01R31/3185S11D:	. . . . . . . Delay testing
G01R31/3185S12:	. . . . . . Design for test
G01R31/3185S12N:	. . . . . . . with partial scan or non-scannable parts
G01R31/3185S12S:	. . . . . . . Security aspects
G01R31/3185S12T:	. . . . . . . Tools
G01R31/3185S13:	. . . . . . Timing aspects clock circuits G01R31/3185S4
G01R31/3185S14:	. . . . . . JTAG or boundary scan test of memory devices other scan testing of memories G11C29/32
G01R31/3185S1T:	. . . . . . . Topological or mechanical aspects
G01R31/3185S2:	. . . . . . Scan latches or cell details
G01R31/3185S3:	. . . . . . Scanning methods, algorithms and patterns G01R31/3183 takes precedence
G01R31/3185S3D:	. . . . . . . Data generators or compressors
G01R31/3185S3I:	. . . . . . . Interconnection testing, e.g. crosstalk, shortcircuits
G01R31/3185S4:	. . . . . . Clock circuits details
G01R31/3185S5:	. . . . . . Control logic
G01R31/3185S6:	. . . . . . Addressing or selecting of subparts of the device under test
G01R31/3185S6I:	. . . . . . . Identification of the subpart
G01R31/3185S6M:	. . . . . . . Multiple simultaneous testing of subparts
G01R31/3185S7:	. . . . . . Comparators; Diagnosing the device under test
G01R31/3185S8:	. . . . . . Error indication, logging circuits
G01R31/3185S9:	. . . . . . Input/Output interfaces
G01R31/3187:	. . . . Built-in tests
G01R31/319:	. . . . Tester hardware, i.e. output processing circuit logic analyzers G01R31/3177, Memory tester hardware G11C29/00T
G01R31/3193:	. . . . . with comparison between actual response and known fault free response (receiver details 31/319S3)
G01R31/3193C:	. . . . . . Comparators
G01R31/3193S:	. . . . . . Storing data, e.g. failure memory
G01R31/3193T:	. . . . . . Timing aspects, e.g. measuring propagation delay G01R31/319C4C and G01R31/319S2 take precedence; marginal testing G06F11/24
G01R31/319A:	. . . . . [N: Analysis of tester Performance; Tester characterization]
G01R31/319C:	. . . . . tester configuration
G01R31/319C1:	. . . . . . Interface with the device under test (DUT), e.g. arrangements between the test head and the DUT, mechanical aspects, fixture
G01R31/319C2:	. . . . . . Modular tester, e.g. controlling and coordinating instruments in a bus based architecture
G01R31/319C4:	. . . . . . Tester set-up, e.g. configuring the tester to the device under test (DUT), down loading test patterns
G01R31/319C4C:	. . . . . . . Calibration
G01R31/319C5:	. . . . . . Tester/user interface
G01R31/319C6:	. . . . . . Portable Testers
G01R31/319C7:	. . . . . . In-circuit Testers
G01R31/319C8:	. . . . . . Verifying whether the DUT is ready for test (required DUT, DUT position, required test mode, required contacts, required DUT quality etc)
G01R31/319S:	. . . . . Stimuli generation or application of test patterns to the device under test (DUT)
G01R31/319S1:	. . . . . . Storing and outputting test patterns G01R31/319S3 takes precedence; arithmetic and random test patterns generator G06F11/273G
G01R31/319S1C:	. . . . . . . using compression techniques, e.g. patterns sequencer
G01R31/319S2:	. . . . . . Timing generation or clock distribution G01R31/319C4C takes precedence
G01R31/319S3:	. . . . . . Voltage or current aspects, e.g. driver, receiver
G01R31/319S4:	. . . . . . Routing signals to or from the device under test (DUT), e.g. switch matrix, pin multiplexing
G01R31/319S5:	. . . . . . Formatter driver, receiver details G01R31/319S3
G01R31/327:	. Testing of circuit interrupters, switches or circuit-breakers
G01R31/327B:	. . of high voltage or medium voltage devices G01R31/333 takes precedence
G01R31/327B2:	. . . Apparatus, systems or circuits therefor G01R31/327B3 takes precedence
G01R31/327B2B:	. . . . Details related to measuring, e.g. sensing, displaying or computing; Measuring of variables related to the contact pieces, e.g. wear, position or resistance measuring contact resistance G01R27/20B
G01R31/327B3:	. . . Fault detection or status indication
G01R31/327C:	. . of low voltage devices, e.g. domestic or industrial devices, such as motor protections, relays, rotation switches
G01R31/327C2:	. . . of relays, solenoids or reed switches measuring contact resistance G01R27/20B; testing electric windings G01R31/06; high voltage magnetic switches G01R31/327B, G01R31/333; monitoring of fail safe circuits H01H47/00C [M1112]
G01R31/333:	. . Testing of the switching capacity of high-voltage circuit-breakers; Testing of breaking capacity or related variables, e.g. post arc current or transient recovery voltage
G01R31/333B:	. . . Apparatus, systems or circuits therefor
G01R31/333B2:	. . . . Synthetic testing, i.e. with separate current and voltage generators simulating distance fault conditions
G01R31/34:	. Testing dynamo-electric machines testing of armature or field winding of dynamo-electric machines G01R31/06B
G01R31/34B:	. . in operation
G01R31/34C:	. . Testing of armature or field windings
G01R31/36:	. Apparatus for testing electrical condition of accumulators or electric batteries, e.g. capacity or charge condition
G01R31/36M:	. .  Monitoring, i.e. determining some variables continuously or repeatedly over time, e.g. monitoring state of charge (SoC) (G01R31/36T takes precedence)[N0304]
G01R31/36M1:	. . . based on combined current and voltage measurements[N0304]
G01R31/36M1J:	. . . . involving current integration[N0304]
G01R31/36M2:	. . . based on current measurements only[N0304]
G01R31/36M2J:	. . . . involving current integration[N0304]
G01R31/36M2J2:	. . . . . using analog integrators, e.g. coulomb-meters[N0304]
G01R31/36M2J3:	. . . . . integrating during discharge only (G01R31/36M2J2 takes precedence)[N0304]
G01R31/36M3:	. . . based on voltage measurements only[N0304]
G01R31/36M3V:	. . . . involving comparison with a reference voltage[N0304]
G01R31/36M3V2:	. . . . . Circuits therefor[N0304]
G01R31/36M3V2A:	. . . . . . comprising voltage dividers, e.g. resistor ladders[N0304]
G01R31/36N:	. . [N: Monitoring, i.e. measuring or determining some variables continuously or repeatedly over time, e.g. current, voltage, temperature, state-of-charge [SoC] or state-of-health [SoH] (G01R31/36T, G01R31/36V take precedence)]
G01R31/36N1:	. . . [N: using current integration]
G01R31/36N1B:	. . . . [N: without voltage measurement]
G01R31/36N1B1:	. . . . . [N: using analog integrators, e.g. coulomb-meters]
G01R31/36N2:	. . . [N: based on measuring voltage only (by comparing voltage with a reference value G01R19/165G2B)]
G01R31/36N3:	. . . [N: based on combined voltage and current measurement (G01R31/36N1 takes precedence)]
G01R31/36T:	. . Testing, i.e. making a one-time determination of some variables, e.g. testing ampere-hour charge capacity G01R31/36V takes precedence
G01R31/36T2:	. . . based on the use of test loads
G01R31/36T3:	. . . for determining the ampere-hour charge capacity or state-of-charge SoC) (G01R31/36T2 takes precedence
G01R31/36T3V:	. . . . based on voltage measurements
G01R31/36T4:	. . . related to manufacture, e.g. testing after manufacture
G01R31/36V:	. . [N: Various constructional arrangements]
G01R31/36V1:	. . . comprising digital calculation means, e.g. for performing an algorithm
G01R31/36V1A:	. . . . Software aspects, e.g. battery modeling, using look-up tables, neural networks
G01R31/36V1B:	. . . . the digital calculation means being combined with the battery or battery pack
G01R31/36V1C:	. . . . the digital calculation means being separated from the battery or battery pack, e.g. located in a separate charger[N0304]
G01R31/36V1C1:	. . . . .  located in the powered device, e.g. in a mobile phone or a vehicle[N0304][C1103]
G01R31/36V2:	. . . for testing or monitoring individual cells or groups of cells in a battery
G01R31/36V3:	. . . involving measuring the internal battery impedance, conductance or related variables
G01R31/36V4:	. . . whereby the type of battery is of primary emphasis, e.g. determining the type of battery
G01R31/36V4L:	. . . . Lead-acid batteries
G01R31/36V4P:	. . . . Primary cells, i.e. not rechargeable
G01R31/36V5:	. . . for compensating for temperature or ageing
G01R31/36V6:	. . . for determining battery ageing or deterioration, e.g. state-of-health (SoH), state-of-life (SoL)
G01R31/36V7:	. . . for indicating electrical conditions or variables, e.g. visual or audible indicators
G01R31/36V7B:	. . . . the indicator being combined with the battery
G01R31/36V7R:	. . . . the indication being remote from the battery
G01R31/36V8:	. . . for determining the ability of a battery to perform a critical function, e.g. cranking
G01R31/36V9:	. . . Battery pole connectors combined with measurement function end pieces for connections to batteries H01R11/28B
G01R31/36V9P:	. . . .  battery pole connectors combined with measurement function (end pieces for connections to batteries H01R11/28B)[N1103] [M1112]
G01R31/40:	. Testing power supplies comparing current or voltage with a reference level in AC or DC supplies G01R19/165G2
G01R31/40B:	. . Electrical testing of electrical aspects of solar panel power supplies of individual solar cells G01R31/26A3 [M1112]
G01R31/42:	. . AC power supplies G01R31/40B takes precedence [M1109]
G01R31/44:	. Testing lamps
G01R33/00:	Arrangements or instruments for measuring magnetic variables
G01R33/00A:	. Geometrical arrangement of magnetic sensor elements; Apparatus combining different magnetic sensor types G01R33/02A takes precedence
G01R33/00B:	. comprising means, e.g. flux concentrators, flux guides, for guiding or concentrating the magnetic flux, e.g. to the magnetic sensor
G01R33/00C:	. Means for compensating offset magnetic fields or the magnetic flux to be measured; Means for generating calibration magnetic fields
G01R33/00E:	. Electronic aspects, e.g. circuits for stimulation, evaluation, control; Treating the measured signals; calibration G01R33/00C takes precedence
G01R33/00E2:	. . Treating the measured signals, e.g. removing offset or noise
G01R33/00E3:	. . Calibration of single magnetic sensors, e.g. integrated calibration
G01R33/00E5:	. . [N: using feed-back or modulation techniques]
G01R33/00H:	. Housings or packaging of magnetic sensors packaging of semiconductor devices H01L23/00; Holders
G01R33/00M:	. Manufacturing aspects; Manufacturing of single devices, i.e. of semiconductor magnetic sensor chips devices based on galvano-magnetic effect or the like H01L43/12
G01R33/00R:	. using bistable elements, e.g. Reed switches
G01R33/00S:	. comprising means for performing simulations, e.g. of the magnetic variable to be measured
G01R33/00T:	. Environmental aspects, e.g. temperature variations, radiation, stray fields G01R33/025 takes precedence
G01R33/00T1:	. . Protection, e.g. with housings against stray fields
G01R33/00T3:	. . Compensation, e.g. compensating for temperature changes
G01R33/00U:	. [N: use of bistable or switching devices, e.g. Reed-switches]
G01R33/00V:	. [N: Sensor arrays]
G01R33/02:	. Measuring direction or magnitude of magnetic fields or magnetic flux
G01R33/022:	. . Measuring gradient
G01R33/025:	. . Compensating stray fields compensating compasses G01C17/38G01R33/00C takes precedence
G01R33/028:	. . Electrodynamic magnetometers
G01R33/028B:	. . . in which a current or voltage is generated due to relative movement of conductor and magnetic field
G01R33/028M:	. . . comprising micro-electromechanical systems [MEMS (MEMS devices in general B81B)]
G01R33/02A:	. . Three-component magnetometers
G01R33/02E:	. . using deviation of charged particles by the magnetic field
G01R33/032:	. . using magneto-optic devices, e.g. Faraday, Cotton-Mouton effect magneto-optics in general G02F1/09
G01R33/032B:	. . . using the Faraday or Voigt effect
G01R33/032C:	. . . using the Kerr effect
G01R33/032F:	. . . with application of magnetostriction
G01R33/035:	. . using superconductive devices manufacture of superconducting elements H01L39/00
G01R33/035B:	. . . Superconductive magneto-resistances
G01R33/035C:	. . . SQUIDS
G01R33/035C2:	. . . . with flux feedback
G01R33/035C3:	. . . . coupling the flux to the SQUID gradiometer coils G01R33/022; coils with superconductive winding H01F6/06
G01R33/36F:	. . . . . "SQUID"-based signal detection[N9506]
G01R33/36P:	. . . . . RF power amplifiers[N9610]
G01R33/36R:	. . . . . NMR receivers/demodulators[N9610]
G01R33/038:	. . using permanent magnets, e.g. balances, torsion devices electro-dynamic magnetometers G01R33/028
G01R33/038B:	. . . in relation with magnetic force measurements magnetic force microscopes G01Q60/50
G01R33/04:	. . using the flux-gate principle
G01R33/48C:	. . . . by low main B0 fields; with pulsed main field or direction rotated main field; by additional fields to the main field; by nonresonant excitation[N9506]
G01R33/48D:	. . . .  MR involving a non-standard polarizing magnetic field B0, e.g. MR in the earth's magnetic field or nano-Tesla spectroscopy, fringe field MR, involving a polarizing magnetic field additional to B0, e.g. for pre-polarization[N9610][C1008]
G01R33/48H:	. . . . Multifrequency selective RF pulses, e.g. multinuclear or multi-slice acquisition mode[N9506]
G01R33/04B:	. . . in single-, or multi-aperture elements
G01R33/05:	. . . in thin-film element
G01R33/54A:	. . . . . Selecting particular volumes or slices of interest, e.g. non-orthogonal or inclined slices, off-center or zoom imaging[C9610]
G01R33/54B:	. . . . . based on Fourier methods, e.g. spin warp[N9610]
G01R33/54B1:	. . . . . . based on Fourier imaging in 3 dimensions[N9610]
G01R33/54B2:	. . . . . . based on multi-slice imaging[N9610]
G01R33/54B3:	. . . . . . Generating imaging signals for different chemical species, e.g. water-fat imaging[N9610]
G01R33/54S:	. . . . .  NMR imaging of samples with ultrashort relaxation times such as solid samples, e.g. MRI using ultrashort TE [UTE, single point imaging, constant time imaging] [N9610][C1008]
G01R33/56A:	. . . . . .  characterised by the geometry of the k-space trajectory, e.g. using a spiral or radial trajectory[N1008]
G01R33/06:	. . using galvano-magnetic devices, e.g. Hall effect devices; using magneto-resistive devices manufacture of galvano-magnetic elements H01L43/00
G01R33/06A:	. . . Magneto-impedance sensors; Nanocristallin sensors
G01R33/06T:	. . . [N: field-effect magnetic sensors, e.g. magnetic transistor ]
G01R33/07:	. . . Hall effect devices
G01R33/07A:	. . . . Constructional adaptation of the sensor to specific applications
G01R33/07A1:	. . . . . [N: Hall devices configured for spinning current measurements]
G01R33/07V:	. . . . Vertical Hall-effect devices
G01R33/09:	. . . Magnetoresistive devices
G01R33/09A:	. . . . Constructional adaptation of the sensor to specific applications
G01R33/09B:	. . . . [N: using multilayer structures, e.g. giant magnetoresistance sensors (thin magnetic films H01F10/00)]
G01R33/09E:	. . . . [N: extraordinary magnetoresistance sensors]
G01R33/09R:	. . . . [N: anisotropic magnetoresistance sensors]
G01R33/09T:	. . . . [N: comprising tunnel junctions, e.g. tunnel magnetoresistance sensors]
G01R33/10:	. . Plotting field distribution; Measuring field distribution
G01R33/12:	. Measuring magnetic properties of articles or specimens of solids or fluids using magnetic-optic devices G01R33/032
G01R33/12B:	. . Testing individual magnetic storage devices e.g. records carriers or digital storage elements functional testing G06F11/00, G06F11/28
G01R33/12C:	. . Measuring magnetisation; Particular magnetometers therefor G01R33/14 takes precedence; electrodynamic magnetometers G01R33/028
G01R33/12D:	. . Measuring permeability, i.e. permeameters G01R33/14 takes precedence
G01R33/12E:	. . Measuring loss due to hysteresis G01R33/14 takes precedence [M1201]
G01R33/12G:	. . Measuring super-conductive properties
G01R33/12G2:	. . . Measuring critical current
G01R33/12H:	. . Measuring galvano-magnetic properties [M1201]
G01R33/12L:	. . [N: using levitation techniques]
G01R33/12M:	. . of molecules labeled with magnetic beads magnetic particles for bio assay G01N33/543D4
G01R33/12P:	. . of magnetic particles, e.g. imaging of magnetic nanoparticles G01R33/12M takes precedence
G01R33/12S:	. . Spin resolved measurements; Influencing spins during measurements, e.g. in spintronics devices G01R33/09B takes precedence; semiconductor devices using spin polarized carriers H01L29/66S
G01R33/12W:	. . Measuring domain wall position or domain wall motion
G01R33/14:	. . Measuring or plotting hysteresis curves G01R33/12B takes precedence
G01R33/16:	. . Measuring susceptibility G01R33/12G takes precedence
G01R33/18:	. . Measuring magnetostrictive properties
G01R33/20:	. involving magnetic resonance
G01R33/24:	. . for measuring direction or magnitude of magnetic fields or magnetic flux
G01R33/24A:	. . . Spatial mapping of the polarizing magnetic field
G01R33/24C:	. . . Spatial mapping of the RF magnetic field B1
G01R33/26:	. . . using optical pumping optical pumping in general G01N24/00D
G01R33/28:	. . Details of apparatus provided for in groups G01R33/44 to G01R33/64 [M1108]
G01R33/28A:	. . . [N: Means for the use of in vitro contrast agents (G01R33/28B takes precedence; involving use of a contrast agent in MR imaging G01R33/56B; in vivo contrast agents A61K49/00F)]
G01R33/28B:	. . . [N: Means specially adapted for hyperpolarisation or for hyperpolarised contrast agents, e.g. for the generation of hyperpolarised gases using optical pumping cells, for storing hyperpolarised contrast agents or for the determination of the polarisation of a hyperpolarised contrast agent]
G01R33/28F:	. . . Intercom or optical viewing arrangements, structurally associated with NMR apparatus
G01R33/28G:	. . .  patient positioning or alignment, or transport arrangements[N1008]
G01R33/28H:	. . . Invasive instruments, e.g. catheters or biopsy needles, specially adapted for tracking, guiding or visualization by NMR
G01R33/28H1:	. . . . involving passive visualization of interventional instruments, i.e. making the instrument visible as part of the normal MR process
G01R33/28H2:	. . . . involving active visualization of interventional instruments, e.g. using active tracking RF coils or coils for intentionally creating magnetic field inhomogeneities
G01R33/28P:	. . .  Provisions for reducing electric or magnetic interference between the MR device and additional hardware specially adapted for MR, e.g. electric or magnetic shielding of additional hardware; provisions for making the additional hardware transparent for MR, e.g. a stent which is not shielding its lumen from MR[N1108]
G01R33/28S:	. . . Provisions within MR facilities for enhancing safety during MR, e.g. reduction of the specific absorption rate [SAR , detection of ferromagnetic objects in the scanner room]
G01R33/30:	. . . Sample handling arrangements, e.g. sample cells, spinning mechanisms
G01R33/30M:	. . . . Miniaturized sample handling arrangements for sampling small quantities, e.g. flow-through micro-fluidic NMR chips
G01R33/30P:	. . . . specially adapted for high-pressure applications
G01R33/30S:	. . . . specially adapted for moving the sample relative to the MR system, e.g. spinning mechanisms, flow cells or means for positioning the sample inside a spectrometer [
G01R33/31:	. . . . Temperature control thereof
G01R33/32:	. . . Excitation or detection systems, e.g. using radio frequency signals
G01R33/32A:	. . . . Detection of MR without the use of RF or microwaves, e.g. force-detected MR, thermally detected MR, MR detection via electrical conductivity, optically detected MR
G01R33/32A1:	. . . . . involving a SQUID
G01R33/34:	. . . . Constructional details, e.g. resonators, specially adapted to MR (aerials in general H01Q)
G01R33/341:	. . . . . comprising surface coils
G01R33/3415:	. . . . . . comprising arrays of sub-coils, i.e. phased-array coils with fileiple receiver channels [M1108]
G01R33/341F:	. . . . . . comprising quadrature surface coils[N9506]
G01R33/343:	. . . . . of slotted-tube or loop-gap type
G01R33/345:	. . . . . of waveguide type G01R33/343 takes precedence
G01R33/345A:	. . . . . . Transverse electromagnetic [TEM coils]
G01R33/345A1:	. . . . . . . Stripline resonators
G01R33/345B:	. . . . . .  Stripline resonators[N1008]
G01R33/34A:	. . . . . Manufacture of RF coils, e.g. using printed circuit board technology; additional hardware for providing mechanical support to the RF coil assembly or to part thereof, e.g. a support for moving the coil assembly relative to the remainder of the MR system
G01R33/34B:	. . . . . Temperature-controlled RF coils
G01R33/34B1:	. . . . . . Superconducting RF coils
G01R33/34B2:	. . . . . . Means for cooling of the RF coils, e.g. a refrigerator or a cooling vessel specially adapted for housing an RF coil
G01R33/34C:	. . . . . Loopless coils, i.e. linear wire antennas
G01R33/34F:	. . . . . Volume type coils, e.g. bird-cage coils; Quadrature bird-cage coils; Circularly polarised coils
G01R33/34F1:	. . . . . . Solenoid coils; Toroidal coils
G01R33/34F2:	. . . . . . Helmholtz coils
G01R33/34F3:	. . . . . . Saddle coils
G01R33/34F4:	. . . . . . Birdcage coils
G01R33/34G:	. . . . . implantable coils or coils being geometrically adaptable to the sample, e.g. flexible coils or coils comprising mutually movable parts
G01R33/34S:	. . . . . RF coils specially adapted for NMR spectrometers
G01R33/36:	. . . . Electrical details, e.g. matching or coupling of the coil to the receiver
G01R33/36A:	. . . . . RF waveform generators, e.g. frequency generators, amplitude-, frequency- or phase modulators or shifters, pulse programmers, digital to analog converters for the RF signal, means for filtering or attenuating of the RF signal
G01R33/36B:	. . . . . RF power amplifiers
G01R33/36C:	. . . . . NMR receivers or demodulators, e.g. preamplifiers, means for frequency modulation of the MR signal using a digital down converter, means for analog to digital conversion [ADC or for filtering or processing of the MR signal such as bandpass filtering, resampling, decimation or interpolation]
G01R33/36G:	. . . . . Tuning/matching of the transmit/receive coil
G01R33/36G2:	. . . . . . Multi-frequency operation
G01R33/36H:	. . . . . Mutual coupling or decoupling of multiple coils, e.g. decoupling of a receive coil from a transmission coil, or intentional coupling of RF coils, e.g. for RF magnetic field amplification
G01R33/36H1:	. . . . . . Decoupling of multiple RF coils wherein the multiple RF coils have the same function in MR, e.g. decoupling of a receive coil from another receive coil in a receive coil array, decoupling of a transmission coil from another transmission coil in a transmission coil array
G01R33/36H2:	. . . . . . Decoupling of multiple RF coils wherein the multiple RF coils do not have the same function in MR, e.g. decoupling of a transmission coil from a receive coil
G01R33/36K:	. . . . . Switching for purposes other than coil coupling or decoupling, e.g. switching between a phased array mode and a quadrature mode, switching between surface coil modes of different geometrical shapes, switching from a whole body reception coil to a local reception coil or switching for automatic coil selection in moving table MR or for changing the field-of-view G01R33/36M takes precedence
G01R33/36M:	. . . . . [N: involving modulation of the quality factor of the RF coil (G01R33/36H takes precedence)]
G01R33/36Q:	. . . . . involving quadrature drive or detection, e.g. a circularly polarized RF magnetic field
G01R33/36T:	. . . . . Means for reducing sheath currents, e.g. RF traps, baluns
G01R33/36W:	. . . . . involving signal transmission without using electrically conductive connections, e.g. wireless communication or optical communication of the MR signal or an auxiliary signal other than the MR signal
G01R33/38:	. . . Systems for generation, homogenisation or stabilisation of the main or gradient magnetic field [M1108]
G01R33/381:	. . . . using electromagnets
G01R33/3815:	. . . . . with superconducting coils, e.g. power supply therefor
G01R33/383:	. . . . using permanent magnets
G01R33/385:	. . . . using gradient magnetic field coils
G01R33/385A:	. . . . . Gradient amplifiers; means for controlling the application of a gradient magnetic field to the sample, e.g. a gradient signal synthesizer
G01R33/385F:	. . . . . means for active and/or passive vibration damping or acoustical noise suppression in gradient magnet coil systems
G01R33/385H:	. . . . . Means for cooling the gradient coils or thermal shielding of the gradient coils
G01R33/385M:	. . . . . Manufacture and installation of gradient coils, means for providing mechanical support to parts of the gradient-coil assembly Manufacture of inductances or coils in general H01F41/00
G01R33/387:	. . . . Compensation of inhomogeneities
G01R33/3873:	. . . . . using ferromagnetic bodies; Passive shimming
G01R33/3875:	. . . . . using correction coil assemblies, e.g. active shimming [M1108]
G01R33/389:	. . . . Field stabilisation, e.g. by field measurements and control means or indirectly by current stabilisation
G01R33/38A:	. . . . Manufacture or installation of magnet assemblies; Additional hardware for transportation or installation of the magnet assembly or for providing mechanical support to components of the magnet assembly
G01R33/38C:	. . . . Additional hardware for cooling or heating of the magnet assembly, for housing a cooled or heated part of the magnet assembly or for temperature control of the magnet assembly
G01R33/38F:	. . . . Open magnet assemblies for improved access to the sample, e.g. C-type or U-type magnets
G01R33/38H:	. . . . Magnet assemblies for single-sided MR wherein the magnet assembly is located on one side of a subject only; Magnet assemblies for inside-out MR, e.g. for MR in a borehole or in a blood vessel, or magnet assemblies for fringe-field MR [M1108]
G01R33/42:	. . . Screening
G01R33/421:	. . . . of main or gradient magnetic field
G01R33/421A:	. . . . . of the gradient magnetic field, e.g. using passive or active shielding of the gradient magnetic field [M1108]
G01R33/422:	. . . . of the radio frequency field [M1108]
G01R33/44:	. . using nuclear magnetic resonance [NMR] [M1108]
G01R33/44A:	. . .  Making measurements of geologic samples, e.g. measurements of moisture, pH, porosity, permeability, tortuosity or viscosity[N1008] [M1108]
G01R33/44B:	. . .  Measurement of solid, liquid or gas content[N1108]
G01R33/44C:	. . .  Detection of potentially hazardous samples, e.g. toxic samples, explosives, drugs, firearms, weapons[N1108]
G01R33/44D:	. . .  Controlling industrial production systems[N1008]
G01R33/44F:	. . . Nuclear Quadrupole Resonance (NQR) Spectroscopy and Imaging
G01R33/44M:	. . . Assessment of an electric or a magnetic field, e.g. spatial mapping, determination of a B0 drift or dosimetry
G01R33/44M1:	. . . .  Spatial mapping of the main magnetic field B0[N1108]
G01R33/44M2:	. . . .  Spatial mapping of a gradient magnetic field[N1108]
G01R33/44M3:	. . . .  Spatial mapping of the RF magnetic field B1[N1108]
G01R33/44N:	. . . MR involving a non-standard magnetic field B0, e.g. of low magnitude as in the earth's magnetic field or in nanoTesla spectroscopy, comprising a polarizing magnetic field for pre-polarisation, B0 with a temporal variation of its magnitude or direction such as field cycling of B0 or rotation of the direction of B0, or spatially inhomogeneous B0 like in fringe-field MR or in stray-field imaging
G01R33/44P:	. . . Multifrequency selective RF pulses, e.g. multinuclear acquisition mode spatially selective RF pulses G01R33/483B
G01R33/44Q:	. . .  Structure determination of a chemical compound, e.g. of a biomolecule such as a protein[N1108]
G01R33/44R:	. . . Relaxometry, i.e. quantification of relaxation times or spin density G01R33/50 takes precedence
G01R33/44S:	. . .  Assessment or manipulation of a chemical or biochemical reaction, e.g. verification whether a chemical reaction occurred or whether a ligand binds to a receptor in drug screening or assessing reaction kinetics[N1108]
G01R33/46:	. . . NMR spectroscopy [M1108]
G01R33/465:	. . . . applied to biological material, e.g. in vitro testing
G01R33/46A:	. . . . RF excitation sequences for enhanced detection, e.g. NOE, polarisation transfer, selection of a coherence transfer pathway
G01R33/46B:	. . . . using specific RF pulses or specific modulation schemes, e.g. stochastic excitation, adiabatic RF pulses, composite pulses, binomial pulses, Shinnar-le-Roux pulses, spectrally selective pulses not being used for spatial selection [M1108]
G01R33/46C:	. . . . Processing of acquired signals, e.g. elimination of phase errors, baseline fitting, chemometric analysis
G01R33/46M:	. . . . Sequences for multi-dimensional NMR
G01R33/46S:	. . . . Sequences for NMR spectroscopy of samples with ultrashort relaxation times such as solid samples
G01R33/48:	. . . NMR imaging systems [M1108]
G01R33/483:	. . . . with selection of signals or spectra from particular regions of the volume, e.g. in vivo spectroscopy [M1108]
G01R33/483A:	. . . . . using B1 gradients, e.g. rotating frame techniques, use of surface coils
G01R33/483B:	. . . . . using spatially selective excitation of the volume of interest, e.g. selecting non-orthogonal or inclined slices [M1108]
G01R33/483B1:	. . . . . . of multiple slices
G01R33/483B2:	. . . . . . using slective suppression or saturation of the signals of the outer volume[N9610]
G01R33/483B3:	. . . . . . using an RF pulse being spatially selective in more than one spatial dimension, e.g. a 2D pencil-beam excitation pulse
G01R33/483B5:	. . . . . . using selective excitation of the volume of interest, e.g. STEAM[N9610]
G01R33/483B6:	. . . . . . using add/subtract methods, e.g. ISIS[N9610]
G01R33/483C:	. . . . . using spatially selective suppression or saturation of MR signals
G01R33/485:	. . . . . based on chemical shift information CSI or spectroscopic imaging, e.g. to acquire the spatial distributions of metabolites
G01R33/48B:	. . . . Travelling-wave MR [M1108]
G01R33/48G:	. . . . Spatially selective measurement of temperature or pH [M1109]
G01R33/48K:	. . . . Functional imaging of brain activation
G01R33/48M:	. . . . Multimodal MR, e.g. MR combined with positron emission tomography [PET , MR combined with ultrasound or MR combined with computed tomography [CT]]
G01R33/48M1:	. . . . . MR combined with positron emission tomography [PET or single photon emission computed tomography [SPECT]]
G01R33/48M2:	. . . . . MR combined with X-ray or computed tomography [CT ]
G01R33/48M3:	. . . . . MR combined with ultrasound
G01R33/48S:	. . . . NMR imaging of samples with ultrashort relaxation times such as solid samples, e.g. MRI using ultrashort TE [UTE , single point imaging, constant time imaging]
G01R33/48T:	. . . . MR characterised by data acquisition along a specific k-space trajectory or by the temporal order of k-space coverage, e.g. centric or segmented coverage of k-space
G01R33/48T1:	. . . . . using a Cartesian trajectory
G01R33/48T1A:	. . . . . . in three dimensions
G01R33/48T2:	. . . . . using a non-Cartesian trajectory
G01R33/48T2A:	. . . . . . in three dimensions
G01R33/48W:	. . . . Resolving the MR signals of different chemical species, e.g. water-fat imaging
G01R33/50:	. . . . based on the determination of relaxation times, e.g. T1 measurement by IR sequences; T2 measurement by multiple-echo sequences
G01R33/54:	. . . . Signal processing systems, e.g. using pulse sequences, Generation or control of pulse sequences (in general H03K); Operator Console
G01R33/54C:	. . . . . Control of the operation of the MR system, e.g. setting of acquisition parameters prior to or during MR data acquisition, dynamic shimming, use of one or more scout images for scan plane prescription G01R33/54D takes precedence
G01R33/54D:	. . . . . Interface between the MR system and the user, e.g. for controlling the operation of the MR system or for the design of pulse sequences
G01R33/56:	. . . . . Image enhancement or correction, e.g. subtraction or averaging techniques, e.g. improvement of signal-to-noise ratio and resolution (image data processing in general G06T) [M1108]
G01R33/561:	. . . . . . by reduction of the scanning time, i.e. fast acquiring systems, e.g. using echo-planar pulse sequences [M1108]
G01R33/561A:	. . . . . . . Parallel magnetic resonance imaging, e.g. sensitivity encoding [SENSE , simultaneous acquisition of spatial harmonics [SMASH], unaliasing by Fourier encoding of the overlaps using the temporal dimension [UNFOLD], k-t-broad-use linear acquisition speed-up technique [k-t-BLAST], k-t-SENSE ] [M1108]
G01R33/561A1:	. . . . . . . . Parallel RF transmission, i.e. RF pulse transmission using a plurality of independent transmission channels
G01R33/561B:	. . . . . . . Generating steady state signals, e.g. low flip angle sequences (FLASH)
G01R33/561B1:	. . . . . . . . using a fully balanced steady-state free precession [bSSFP pulse sequence, e.g. trueFISP]
G01R33/561D:	. . . . . . . Echo train techniques involving acquiring plural, differently encoded, echo signals after one RF excitation, e.g. using gradient refocusing in echo planar imaging [EPI , RF refocusing in rapid acquisition with relaxation enhancement [RARE] or using both RF and gradient refocusing in gradient and spin echo imaging [GRASE] ] [M1108]
G01R33/561D1:	. . . . . . . . using gradient refocusing, e.g. EPI
G01R33/561D2:	. . . . . . . . using RF refocusing, e.g. RARE
G01R33/561D3:	. . . . . . . . using both RF and gradient refocusing, e.g. GRASE
G01R33/561D4:	. . . . . . . . Correction of the acquired signals, e.g. correction for readout gradients of alternating polarity[N9610]
G01R33/561G:	. . . . . . . with short relaxation time T2 in solials, e.g. using DANTE pulse sequence[N9506]
G01R33/561K:	. . . . . . . by temporal sharing of data, e.g. keyhole, block regional interpolation scheme for k-Space [BRISK ] [M1108]
G01R33/561M:	. . . . . . .  Dynamic imaging, e.g. cine imaging[N1008]
G01R33/563:	. . . . . . of moving material, e.g. flow contrast angiography [M1108]
G01R33/563A:	. . . . . . . Characterization of motion or flow; Dynamic imaging
G01R33/563A1:	. . . . . . . . involving phase contrast techniques
G01R33/563A2:	. . . . . . . .  involving time-of-flight techniques[N1008]
G01R33/563A3:	. . . . . . . . Cine imaging
G01R33/563A4:	. . . . . . . . Involving spatial modulation of the magnetization within an imaged region, e.g. spatial modulation of magnetization [SPAMM tagging ]
G01R33/563C:	. . . . . . . Diffusion imaging
G01R33/563G:	. . . . . . .  involving tagging techniques[N1008]
G01R33/563K:	. . . . . . . Angiography, e.g. contrast-enhanced angiography [CE-MRA or time-of-flight angiography [TOF-MRA] ] [M1108]
G01R33/563M:	. . . . . . . Elastography
G01R33/563P:	. . . . . . . Perfusion imaging
G01R33/563T:	. . . . . . . Intentional motion of the sample during MR, e.g. moving table imaging [M1108]
G01R33/563T1:	. . . . . . . . involving motion of the sample as a whole, e.g. multistation MR or MR with continuous table motion
G01R33/563T2:	. . . . . . . . involving motion of a part of the sample with respect to another part of the sample, e.g. MRI of active joint motion
G01R33/565:	. . . . . . Correction of image distortions, e.g. due to magnetic field inhomogeneities [M1108]
G01R33/565A:	. . . . . . . due to motion, displacement or flow, e.g. gradient moment nulling G01R33/567 takes precedence [M1108]
G01R33/565B:	. . . . . . . due to eddy currents, e.g. caused by switching of the gradient magnetic field [M1108]
G01R33/565C:	. . . . . . . due to chemical shift effects
G01R33/565H:	. . . . . . . due to magnetic susceptibility variations
G01R33/565I:	. . . . . . . caused by finite or discrete sampling, e.g. Gibbs ringing, truncation artefacts, phase aliasing artefacts
G01R33/565J:	. . . . . . . caused by acquiring plural, differently encoded echo signals after one RF excitation, e.g. correction for readout gradients of alternating polarity in EPI
G01R33/565K:	. . . . . . . [N: caused by a distortion of the main magnetic field B0, e.g. temporal variation of the magnitude or spatial inhomogeneity of B0 (G01R33/565A, G01R33/565B, G01R33/565H take precedence)]
G01R33/565M:	. . . . . . . due to Maxwell, i.e. concomitant fields[N0506]
G01R33/565P:	. . . . . . . [N: caused by a distortion of a gradient magnetic field, e.g. non-linearity of a gradient magnetic field (G01R33/565A, G01R33/565B, G01R33/565H take precedence)]
G01R33/565P1:	. . . . . . . . due to Maxwell fields, i.e. concomitant fields
G01R33/565R:	. . . . . . . caused by a distortion of the RF magnetic field, e.g. spatial inhomogeneities of the RF magnetic field G01R33/565A, G01R33/565B, G01R33/565H take precedence
G01R33/567:	. . . . . . gated by physiological signals i.e. synchronization of acquired MR data with periodical motion of an object of interest, e.g. monitoring or triggering system for cardiac or respiratory gating [M1108]
G01R33/567A:	. . . . . . . Gating or triggering based on a physiological signal other than an MR signal, e.g. ECG gating or motion monitoring using optical systems for monitoring the motion of a fiducial marker [M1108]
G01R33/567B:	. . . . . . . Gating or triggering based on an MR signal, e.g. involving one or more navigator echoes for motion monitoring and correction [M1108]
G01R33/567D:	. . . . . . . Correction of movement artifacts in the acquired signals[N9610]
G01R33/56B:	. . . . . . involving use of a contrast agent for contrast manipulation, e.g. a paramagnetic, super-paramagnetic, ferromagnetic or hyperpolarised contrast agent
G01R33/56C:	. . . . . . by filtering or weighting based on different relaxation times within the sample, e.g. T1 weighting using an inversion pulse [M1108]
G01R33/56F:	. . . . . . Microscopy; Zooming
G01R33/56H:	. . . . . . by transferring coherence or polarization from a spin species to another, e.g. creating magnetization transfer contrast [MTC , polarization transfer using nuclear Overhauser enhancement [NOE] ] [M1108]
G01R33/56J:	. . . . . . by reducing the NMR signal of a particular spin species, e.g. of a chemical species for fat suppression, or of a moving spin species for black-blood imaging
G01R33/56P:	. . . . . . Data processing and visualization specially adapted for MR, e.g. for feature analysis and pattern recognition on the basis of measured MR data, segmentation of measured MR data, edge contour detection on the basis of measured MR data, for enhancing measured MR data in terms of signal-to-noise ratio by means of noise filtering or apodization, for enhancing measured MR data in terms of resolution by means for deblurring, windowing, zero filling, or generation of gray-scaled images, colour-coded images or images displaying vectors instead of pixels (image data processing or generation, in general G06T)
G01R33/58:	. . . . Calibration of imaging systems, e.g. using test probes , Phantoms; Calibration objects or fiducial markers such as active or passive RF coils surrounding an MR active material [M1108]
G01R33/58F:	. . . . . Calibration of signal excitation or detection systems, e.g. for optimal RF excitation power or frequency G01R33/24C takes precedence
G01R33/58F1:	. . . . . . for optimal flip angle of RF pulses
G01R33/60:	. . using electron paramagnetic resonance
G01R33/62:	. . using double resonance
G01R33/64:	. . using cyclotron resonance Omegatrons per se H01J49/38
G01R35/00:	Testing or calibrating of apparatus covered by the preceding groups [N: (G01R31/319A takes precedence)]
G01R35/00B:	. of cathode ray oscilloscopes
G01R35/00C:	. Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references G01R33/00E3, G01R35/00B take precedence
G01R35/00C2:	. . Standards or reference devices, e.g. voltage or resistance standards, "golden references"
G01R35/02:	. of auxiliary devices, e.g. of instrument tranformers according to prescribed transformation ratio, phase angle, or wattage rating
G01R35/04:	. of instruments for measuring time integral of power or current
G01R35/06:	. . by stroboscopic methods